Test Connections - November 2011

We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.

Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.

PXI for Semiconductor Test: Capabilties and Benefits

Semiconductor manufacturers are constantly looking for ways to lower their cost of test. Read on to learn how Geotest's TS-900 PXI Test System can help manufacturers lower their test costs and raise their test efficiency.
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Characterizing Devices with PXI Instrumentation

Characterizing the DC parameters of digital and mixed signal devices has largely been a task best done on large, proprietary ATE. Geotest's GX5295 PXI digital instrument with its PMU per pin now makes it possible to perform this task quickly and cost effectively. Read how you can use the GX5295 for device characterization testing.
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Geotest's New High Performance PXI and PXI Express FPGA Cards Offer Users Flexibilty, Performance and Choice

Geotest has recently introduced two new high performance FPGA cards(GX3700 / GX3700e) using the Altera Stratix III devices. Read how you can take advantage of these new high performance FPGA cards for both the PXI and PXI Express archtectures.  
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Newsworthy Happenings

Join Geotest at productronica in Munich, Germany, Nov. 15 - 18. Find out more about productronica and other news events including new product introductions.
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Looking to generate test applications faster? Open-architecture-based ATEasy is the answer. Download your no-cost 30-day trial today!
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The GTX2200 Timer Counters include a gate function for frequency and time measurement. Read how this function works when making frequency / time measurements.

Read on to learn more.
Read the blog post here.
Waveform Generation Language (WGL) files are a common file format used to describe test vectors for semiconductor devices. Read how Geotest software tools can be used to translate the WGL format to Geotest digital format.

Click here to learn more.
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