Search Results - Digital and Analog Test System Platform TS 323 Series

Search Results For: "DIGITAL AND ANALOG TEST SYSTEM PLATFORM TS 323 SERIES" | Marvin Test Solutions, Inc. Sign In Cart Test Solutions Aircraft F-15 F-16 F/A-18 F-35 AH-64 Remotely Piloted Aircraft (RPA) Weapons Systems AGM-65 Maverick AGM-114 Hellfir...

The TS-323 is available with range of digital and analog instrument options for addressing both LRU and SRU test needs as well as supporting depot and manufacturing test needs. The TS-323 switching subsystem supports "any resource to any pin" archite...

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“The GENASYS platform combines all of the benefits and performance of the PXI architecture with features and requirements found in legacy ATE systems,” said Michael Dewey, Geotest's Senior Product Marketing Manager. “The TS-323 employs our market leading G...

Contains (4) 500 GB hot swappable HDDs Keyboard SmartCard CCID Keyboard Monitor 24 inch LCD, attached to swing arm on test system Environmental Monitoring (2) velocity sensors (1) temperature sensors Ethernet accessible / controlled Core System Configuration D...

The GENASYS platform and its subsystems has wide applicability for both factory and depot applications – solving both the legacy and future test needs for high value, mission critical products. Read more...

The GENASYS platform and its subsystems has wide applicability for both factory and depot applications – solving both the legacy and future test needs for high value, mission critical products. Read more...

Learn more about our Privacy Policy and Terms of Use. OK.

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The GENASYS platform and its subsystems has wide applicability for both factory and depot applications – solving both the legacy and future test needs for high value, mission critical products. Read more...

Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.

Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.

Results from Test Solutions and Products PXI 6U New Product View TS-381 TS-381 Production Test Set for Electronic Systems/Subsystems General Purpose Automatic Test System View TS-321 Series TS-321 Series PXI-based architecture offers compact footprint, open ar...

Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.

Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.

Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.

The scalable architecture allows multiple configurations starting at 256 multiplexed hybrid pins, and a mix of low frequency and high frequency switching channels with matrix, multiplexer, or Multi-Matrix topologies. Also included are system power supplies, el...

TS-700 - Preconfigured Functional Test Platform | Marvin Test Solutions, Inc. Sign In Cart Test Solutions Aircraft F-15 F-16 F/A-18 F-35 AH-64 Remotely Piloted Aircraft (RPA) Weapons Systems AGM-65 Maverick AGM-114 Hellfire GBU-xx Paveway AIM-9 Sidewinder Main...

The core system includes a Windows-based embedded controller, digital instrumentation, analog instrumentation, switching, user power, a touch screen monitor, and built-in keyboard / mouse – all contained within a single rack.

Presence of an external 10 MHz PXI clock will synchronize the 100 MHz clock to the external 10 MHz source 100 MHz clock accuracy: ± 30 ppm Synchronization signals: SYNC100 & SYNC_CTRL External 10 MHz Clock Input An external 10 MHz clock source (TTL level) ...

Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.

Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.

Learn more about our Privacy Policy and Terms of Use. OK.

Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.

Learn more about our Privacy Policy and Terms of Use. OK.