Description
The TS-900e-5G mmWave test systems deliver proven performance up to 53 GHz. Two system configurations are available. The TS-900e-5G incorporates laboratory grade PXIe RF instrumentation with a high performance receiver interface for packaged or wafer test / characterization of mmWave devices and the TS-900eX-5G provides users the option to configure the system with LXI or PXIe RF instrumentation. In addition, MTS offers a full suite of digital and parametric test capabilities as well as SPI/I2C interface support for controlling / monitoring the device under test (DUT). Both systems offer a total of 20 PXI / PXIe peripheral slots which can accommodate additional digital and analog test resources.
TS-900e-5G Test System
The TS-900e-5G's compact footprint is the ideal test solution for semiconductor OEMs, device verification, incoming inspection, wafer probing and packaging / test vendors needing a cost-effective, configurable mmWave test system. For multi-site test applications requiring expanded port and instrumentation needs, the TS-900eX-5G offers an expanded RF port count and the option to incorporate both PXI and LXI instrumentation.
TS-900eX-5G Test System
Both systems are compatible with prober and automated device handlers and utilize the same receiver interface, providing device interface board (DIB) compatibility between the two systems. The receiver interface is compatible with the Opus 3 and TEL probe stations as well as the Seiko Epson E8040 & E8080 device handlers. The TS-900e-5G is available with the Reid-Ashman OM-1069 manipulator and the TS-900eX-5G system is available with an inTest manipulator.
The systems include a PXIe chassis with 64 dynamic digital I/O channels, 64 static digital I/O channels, a user programmable power supply, a system self-test and fixture. Additional PXIe slots are available for adding RF instrumentation, more digital and analog test resources as needed.
System software includes DIOEasy for digital waveform editing / display,
ICEasy for device test development, and Marvin Test Solutions'
ATEasy which provides an integrated and complete test executive and test development environment, allowing users to quickly develop and easily maintain test applications.
Features
Both systems can be configured with up to 256 dynamic digital channels. The digital subsystem uses the
GX5295 - a 3U PXI, 32 channel, 100 MHz digital I/O card with per channel parametric measurement units (PMUs). A wide range of digital and analog instrument options can easily be incorporated into the TS-900e-5G systems for supporting both functional and DC parametric test capabilities. RF instrumentation options include the Keysight M9807 / M9808 PXIe VNA or the Rohde and Schwarz ZNBT40 LXI instruments.
TS-900e-5G Series Core System Configuration
The core system components include the following test resources and capabilities:
- ICEasy test software development tools
- ATEasy test executive and programming environment
- GX3104 SMU with 4 channels each (expandable to 16)
- DIOEasy digital waveform editing and display tools
- Embedded i7, quad core controller with Windows®10 OS
- (64) 100 MHz digital channels with per pin PMU (expandable to 256)
- (64) static digital channels (expandable to 128), which can be used for fixture ID, UUT static control or DUT board relay control
- 21-slot, high-power PXI Express chassis
- Pogo pin, blind-mate receiver interface with 24, 53 GHz RF ports (TS-900eX-5G)
- Pogo pin, blind-mate receiver interface with 20, 53 GHz RF ports (TS-900e-5G)
The systems are also available with digital vector conversion tools that support ASCII, WGL, STIL, VCD, eVCD and ATP vector formats (DIOEasy-FIT).
Software
The test systems are supplied with ATEasy - Test development and executive software. It comes with a pre-configured software that includes instrument drivers, virtual instrument panels, a system self-test and ICEasy test software tools which facilitates device test development and characterization.
Applications
- mmWave packaged and wafer device test / characterization
- Pilot production and focused production test
- Automated failure analysis and test
The following screenshots show the various features and capabilities of TS-900e Software:
Test Executive
The test executive with tests listed on the left and a log window that displays test results with an IV curve chart:
Test Executive Displaying Test Log and IV Curve PlotIV Curve Tracer Tool
The IV Curve Tracer tool can sweep on Voltage or Current and plot the results. You can also append the plot to the test log or export the result to a CSV/Excel file. Multiple pins (a group) can be also plotted on the same chart. The tool can be also called in an automated mode, displaying the results directly to the test log.
IV Curve Tracer ToolShmoo Tool
The Shmoo tool allows you to configure and display Shmoo plots. The plot can be appended to a the test log, printed or you can also export the results to a CSV/Excel file. The tool can be also called in an automated mode, displaying the results directly to the test log.
Shmoo Tool
TS-900e-5G Series Specifications
| mmWave Tests |
|---|
| Tx / Rx Tests | S-Parameter Measurement (Insertion / Return Loss)
S12, S21, S11, S22 |
| TS-900e-5G Series PXIe Chassis |
|---|
| Number of Slots | 1 controller, 8 PXI-1, 8 Hybrid, 4 PXIe |
| System CPU (Embedded) | Intel Core i7, 2.4 GHz, single slot controller
4x4 PCIe bus configuration
8 GB of RAM
|
| System Hard Disk | 320 GB (min) |
| Cooling | (4) 100 CFM fans for system cooling. Integrated temperature monitoring via an on-board microcontroller with audible and software notification when preset temperature limits are exceeded. Fan speed control and monitoring is automatic and can be controlled / monitored via the GxChassis software. |
| PXI Clock | Integrated 10 MHz PXI clock with auto-detect function. Presence of an external 10 MHz PXI clock will disable the internal clock. PXI clock is distributed to all peripheral slots.
Optional external clock via slot 2 |
| Temperature Monitoring | Per slot monitoring, 1 reading/sec/slot
4 second moving average value
User selectable alarm criteria:Accuracy: ± 2 °C
Default warning and shutdown limits: +50 °C & +70 °C
Warning and shutdown limits programmable via software driver
Status: Query via software driver and audible alarm for a warning limit condition |
| Power Supply Monitoring | Monitored voltages: 3.3, 5, +12, -12, VIO value
Accuracy: ± 2% of reading |
| PXI Triggers | Slots: 2 – 21
Number: 8 per segment
Software controlled segment mapping supports:- Isolate a trigger line within a segment
- Map a trigger line left to right
- Map a trigger line right to left
|
PXI Clock and
Synch
Resources | Integrated 10 and 100 MHz clock with an auto-detect function. Presence of an external 10 MHz PXI clock will synchronize the 100 MHz clock to the external 10 MHz source
100 MHz clock accuracy: ± 30 ppm
Synchronization signals: SYNC100 & SYNC_CTRL |
| External 10 MHz Clock Input | An external 10 MHz clock source (TTL level) can be provided via a rear panel BNC or via a PXI Express System Timing Controller |
| 10 MHz Clock Output | 10 MHz output is available via a rear panel BNC connector, TTL compatible level |
| PXIe System Power | 1600 W |
| PXIe Chassis Input AC Power | 120 VAC, ±15%; 20 A max (PFC)
240 VAC, ±10%; 10 A max (PFC)
47 Hz to 440 Hz |
| Dynamic Digital I/O Subsystem |
|---|
| Number of Digital I/O and PMU Channels | 64 (base configuration) |
| Maximum Channel Configuration | 256 channels |
| Maximum Clock Rate | 100 MHz |
| Digital Test Modes | Stimulus / response
Real-time compare |
| Vector Memory | 64 Mb / channel |
| Real Time Compare Record Memory | 1,024 (records data and program steps) |
| Drive Voltage Range | -2 V to +7 V, Drive Hi & Drive Lo, maximum swing is 8 V |
| Sense Voltage Range | -2 V to +7 V, Sense Hi & Sense Lo |
| Programmable Pull-Up / Pull-Down Current Source / Sink | ±24 mA, programmable on a per channel basis,
V commutate range: -2 V to +7 V, programmable on a per channel basis |
| High and Low Commutation Voltage Range | VCLo: -2 V to +5 V
VCHi: 0 V to +7 V |
| Voltage Clamp Accuracy | ±100 mV |
| Parametric Measurement (PMU) |
| Number of Parametric Measurement Units | 32, one per channel
4, one per auxiliary channel (for timing /control & static I/O functions) |
| Configurations | Force Voltage/Measure Current (FVMI)
Force Current/Measure Voltage (FIMV)
Force Voltage/Measure Voltage (FVMV)
Force Current/Measure Current (FIMI) |
| Force Voltage Range | -1.5 V to +7 V |
| Force Voltage Accuracy | ±20 mV |
| Force Voltage Resolution | 16 bits |
| Force Current Ranges | ±32 mA, ±8 mA, ±2 mA, ±512 uA, ±128 uA, ±32 uA, ±8 uA, ±2 uA FS |
Force Current Accuracy:
Compliance Range:
+1.75 V to +7 V @ 32 mA
-1.5 V to +7 V @ no load | ±120 uA, 32 mA range
±40 uA, 8 mA range
±5 uA, 2 mA range
±1.2 uA, 512 uA range
±600 nA, 128 uA range
±160 nA, 32 uA range
±80 nA, 8 uA range
±20 nA, 2 uA range |
Current Measurement Accuracy (60 Measurements / Sec)
Compliance Range:
+1.75 V to +7 V @ 32 mA
-1.5 V to +7 V @ no load | ±120 uA, 32 mA range
±40 uA, 8 mA range
±5 uA, 2 mA range
±1.2 uA, 512 uA range
±600 nA, 128 uA range
±160 nA, 32 uA range
±80 nA, 8 uA range
±20 nA, 2 uA range |
| Measure Voltage Range | -2 V to +7 V |
| Measure Voltage Accuracy | ±1 mV (measurement rate < 200 measurements / sec) |
| Static Digital Instrument |
|---|
| Number of Static Digital I/O Channels | 64, expandable to 128
48 Input / Output ( programmable I/O in groups of eight)
16 inputs for fixture ID |
| Logic Levels | LVTTL compatible |
| Source / Sink Current | 24 mA (max) |
| User Power |
|---|
| Source / Measure Unit (SMU) | 4-channel, 4 quadrant operation, isolated outputs, common ground, with remote sense |
| Programmable Voltage Range | 0 to ±20 V |
| Output Voltage Accuracy | ±0.05% of programmed value + 2 mV |
| Output Noise | < 20 mV p-p, 20 MHz BW, full load |
| Output Current | ±2.5 uA to ±250 mA in decade ranges,
any one channel can supply up to 1A |
| Output Current Accuracy | ±0.05% of programmed value + 0.05% of FS |
| Voltage Measurement Accuracy | ±0.03% of programmed value + 2 mV |
| Current Measurement Accuracy | Ranges: 2.5 uA to 250 mA in decades
Accuracy: ±0.05% of reading + 0.05% of FS range |
| Measurement Resolution | Programmable, 18 to 24 bits |
| TS-900e-5G RF Vector Network Analyzer Options |
|---|
| Keysight Technologies | M9807, 2 port VNA, 40 GHz, PXIe
M9808A, 2 port VNA, 53 GHz, PXIe |
| TS-900eX-5G RF Vector Network Analyzer Options |
|---|
| Rohde and Schwarz | ZNBT40, 24 port, 40 GHz, LXI |
| Keysight Technologies | M9807, 2 port, 40 GHz, PXIe
M9808A, 2 port, 53 GHz, PXIe |
| TS-900eX-5G Sereis Receiver Interface |
|---|
| Type | Modular, pogo-pin and blind-mate RF interface |
| Interfaces | - (4) 128 pin digital blocks
- 20 blind mate RF ports (TS-960e-5G)
- 24 blind mate RF ports (TS-960eX-5G)
(Weinschel Planar Blind-Mate, 2.92mm (SMK)) |
| Environmental / Physical |
|---|
| Operating Temperature | 0 °C to +50 °C |
| Storage Temperature | -20 °C to +60 °C |
Relative Humidity
(Non-Condensing) | 90% |
| Altitude | 30,000 ft |
| TS-900e-5G Weight | 125 lbs, core system |
| TS-900eX-5G Weight | 250 lbs, core system |
| TS-900e-5G Overall Size | 24" D x 22" W x 17" H |
| TS-900eX-5G Overall Size | 24" D x 39" W x 35" H |
| Manipulator Options | TS-900e-5G: Reid-Ashman OM-1069
TS-900eX-5G: inTest 930591 FTM-MVT5900E-5G |
Note: Specifications are subject to change without notice.
Downloads for TS-900e-5G Series
TS900e5GDS.pdf
Oct 19, 2020
version: A
208.79 KB
Download our PXI Catalog
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