New Product
TS-960e-5G

mmWave / 5G Production Test System

  • mmWave Production Test and Characterization
  • 50 GHz Signal Delivery to the Device Under Test
  • Supports Up to 24 Ports for Multi-site Testing
  • DC, Parametric and RF Test Capabilities
  • Compact Form Factor / Footprint
  • Comprehensive ICEasy Semiconductor Test Suite
  • Intuitive ATEasy® - Integrated Test Executive / Development Environment

Description

The TS-960e-5G mmWave test system delivers proven performance up to 50 GHz. The system integrates laboratory grade RF performance directly to the mmWave Device Under Test (DUT) for multi-site production test or device characterization for mmWave devices. In addition, MTS offers a full suite of digital and parametric testing and SPI/I2C interface support to functionally control / monitor the device under test.

The basic PXIe-based system includes 64 dynamic digital I/O channels, 64 static digital I/O channels, a user programmable power supply, a system self-test and fixture. Included system software includes GtDIO6xEasy for digital waveform editing / display, ICEasy for device test development, and Marvin Test Solutions' ATEasy which provides an integrated and complete test executive and test development environment, allowing users to quickly develop and easily maintain test applications. With an additional 16 PXI slots available for adding more digital or analog test resources as needed, the TS-960e-5G is the ideal test solution for semiconductor OEMs, fabless semiconductor vendors, incoming inspection / counterfeit detection labs and packaging / test vendors needing a cost-effective, configurable test system.

For production test applications requiring integration with an automated handler, the TS-960e-5G is available with an inTEST manipulator which provides precise positioning of the test head and the flexibility to interface to automated probers and device handlers. The TS-960e-5G's device interface board (DIB) / receiver interface is designed to be compatible with virtually any device handler.

Features

The TS-960e-5G can be configured with up to 256 dynamic digital channels. The base TS-960e-5G platform uses the GX5295 - a 3U PXI, 32 channel, 100 MHz digital I/O card with per channel parametric measurement units (PMUs). A wide range of digital and analog instrument options can easily be incorporated into the TS-960e-5G, offering users a compact test system that can support both functional and DC parametric test capabilities. The system is also available with digital vector conversion tools that support ASCII, WGL, STIL, VCD, eVCD and ATP vector formats.

TS-960e-5G Core System Configuration

The TS-960e-5G core system includes the following test resources and capabilities:
  • 21-slot, high-power PXI Express chassis with integral receiver interface
  • Embedded i7, quad core controller with Windows®10 OS
  • (64) 100 MHz digital channels with per pin PMU (expandable to 256)
  • (64) static digital channels (expandable to 128), which can be used for fixture ID, UUT static control or DUT board relay control
  • GX3104 SMU with 4 channels each (expandable to 16)
  • ATEasy test executive and programming environment
  • GtDIO6xEasy digital waveform editing and display tool
  • ICEasy test software development tools

Software

The test system is supplied with ATEasy and all instrument drivers, virtual instrument panels, and a system self-test as well as ICEasy test software tools which facilitates device test development and characterization.  

ATEasy supports a wide variety of Windows based APIs including, LabVIEW, CVI, Microsoft® and Borland® C/C++, Microsoft Visual Basic®, and Borland Delphi.

Applications

  • mmWave device / module test and characterization
  • Pilot production and focused production test
  • Automated failure analysis and test