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File import tool for importing and converting STIL, WGL, VCD/EVCD vectors

  • Import and convert STIL digital vectors (IEEE-1450, Standard Test Interface Language files) to MTS digital vector format
  • Import and convert WGL digital vectors (TSSI Waveform Generation Language files) to MTS digital vector format
  • Import and convert VCD/EVCD digital vectors (IEEE-1364, Value Change Dump files) to MTS digital vector format
  • Supports Marvin Test Solutions' GX529x and GX5055 PXI digital instruments
  • Pin remapping supports pin assignment and ignore features
  • Defined profiles supports stored import settings simplifying multiple / repeated file imports / conversions
  • Add-on, licensed option works in conjunction with DIOEasy


Marvin Test Solutions' DIOEasy-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD files to a Marvin Test Solutions' digital instrument file format. DIOEasy-FIT works in conjunction with Marvin Test Solutions' DIOEasy waveform display and editor software which provides an efficient tool set for developing, debugging, and executing digital test vectors for all MTS dynamic digital instruments.

The Standard Test Interface Language (STIL, IEEE-1450) was developed by a consortium of several test equipment vendors, computer aided engineering (CAE), computer aided design (CAD) and integrated circuit (IC) vendors. The standard provides a common language to transfer digital test data vectors from the design environment to the test environment.

The Waveform Generation Language (WGL), pronounced "wiggle", is a data description language created by Test System Strategies Inc. (TSSI). A WGL file is essentially a text file that contains signal patterns along with timing, diagnostics and other information. The WGL vector formats are commonly used by engineers to test semiconductor devices during the design validation and production test phases of product development. These vectors are generated by electronic design automation (EDA) tools and are used to test a device and verify that its physical implementation matches the results achieved in simulation.

The VCD and EVCD file formats are part of the IEEE-1364 (IEEE Standard for Verilog® Hardware Description Language). Extended VCD (EVCD, IEEE-1364-2001) is a newer version of the VCD file format and supports directional data.

DIOEasy-FIT and the GTDIO library provide the functionality for importing the above files and converting them to a DIO file format which can then be loaded into DIO cards. When importing a file, the user can specify the clock rate for the digital instrument's step rate; (for example the default value of 10 ns (100 MHz) is the fastest clock rate for GX5292 board). If the specified clock rate is too slow and cannot satisfy the timing constrains defined in the imported file (e.g clock > UUT output probing window etc.), an error is returned. The generated DIO file supports both stimulus / response and real-time compare (RTC) modes of operation.  


  • Semiconductor test systems
  • Digital test systems
  • Mixed signal testers
  • Digital emulation systems
  • Hybrid & SoC Component Test