Home » » GX5055   (PXI 6U)

Dynamically Controlled, High Voltage Digital I/O PXI Card with Pin Electronics

  • 50 MHz dynamic digital instrument with per pin direction control
  • High performance pin electronics with per pin programmability
  • Dual level drive / sense, programmable load & PMU on a per channel basis
  • Wide drive / sense voltage range: -14 V to +25 V
  • 32 bi-directional I/O pins, supports configurations up to 512 pins
  • 512k memory per channel
  • Dynamically controlled sequencer supports branching, looping, and subroutines


The GX5055 represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the GX5050, the GX5055 offers high performance pin electronics and an enhanced timing generator in a compact, 6U PXI form factor.

Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, providing a single domain and supporting up to 512 bi-directional channels.

Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to measure each UUT node’s DC characteristics.


The GX5055 offers real-time digital  stimulus and capture with 32 pins per card. Each pin can be configured as an input or output on a per cycle basis. Six drive data formats are supported: NR, R1, R0, RZ, RC, CC – providing flexibility to create a variety of bus cycles and waveforms to test board and box level products.

Parametric Measurement Unit (PMU)
Each digital channel of the GX5055 includes a PMU for measuring a UUT’s DC characteristics. The PMU can operate in the force voltage / measure current or force current / measure voltage mode.

Algorithmic Sequencer Technology (AST)
An innovative, state-of-the-art algorithmic sequencer allows users to create loops and branches to manipulate the output vectors. All of the sequencer commands are available and may be programmed using the Graphical Vector Editor using Windows® API command or via a script language. The sequencer allows the user to generate test vectors indefinitely at maximum test rates. Internal and external trigger and pause commands are available in several modes.

On-Board Memory
The GX5055 includes 5 banks of 512 k x 32 memory, supporting drive, sense, direction, control and data valid functionality for each channel.

The GX5055 operates in any 6U PXI chassis that supports an air flow rate of 20 cfm / slot. Power for the pin electronics requires the use of external power supplies or the GX5055 can be used with a Marvin Test Solutions GX7005A PXI chassis which is designed for the GX5055 and includes the necessary pin electronics power supplies. Optionally, for low voltage applications, the GX5055 can be used with a GX7100A chassis and a GX7400A user power supply. This configuration supports up to three GX5055 cards.

Programming and Software

The board is supplied with GTDIO/DIOEasy, a software package that includes vector editing, a virtual instrument panel, and 32/64-bit DLL driver libraries and documentation. The virtual panel can be used to interactively program and control the instrument from a window that displays the instrument’s current settings and status. In addition, interface files are provided to support access to programming tools and languages such as ATEasy, LabView, C/C++, Microsoft Visual Basic®, Delphi, and Pascal. On-Line help file and PDF User's Guide provides documentation that includes instructions for installing, using and programming the board.

Optionally, DtifEasy is available for use with the GX5055. DtifEasy offers a complete LASAR post-processor and test execution environment for post-processing and execution of LASAR generated .tap files.


  • Automatic Test Equipment (ATE)
  • High-speed functional digital test
  • Vector capture
  • Hybrid and digital device test
  • Memory testing
  • LRU and SRU test