GP1612 Series

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Programmable Pulse Generator - HP 8112A Compatible

  • 50 MHz frequency range with 16 VPP into 50 Ω
  • Variable width and delay with variable transitions
  • IEEE 488.2 and SCPI compatible
  • Fully compatible with the Hewlett Packard 8112A Pulse Generator (GP1612H)


The GP1612 features variable pulse widths from 10 ns to 10 sec, delays from 0 ns to 10 sec with up to 6 digits resolution and adjustable output levels from –8 V to +8 V, with pulse amplitudes from 0.1 to 16 VPP into 50 Ω load (.2 to 32 VPP into open circuit). The Pulse Generator also features selectable complementary pulse and double pulse, in continuous, triggered, gated and counted burst modes. The GP1612 allows selection of predefined amplitude for critical stimulus and testing of major semiconductor technologies as TTL, CMOS and ECL.


The GP1612H has been designed to replace the HP8112A Pulse Generator and as such, is compatible with all of the HP 8112A functions and is 100% compatible in its GPIB command set. The GP1612H can replace the obsolete HP8112A in existing test and measurement systems.
The GP1612N offers the same features and capabilities as the GP1612H with a maximum frequency of 20 MHz.

Variable Transitions
To make operation flexible, variable transitions (rise and fall times) can be programmed from 5 ns to 100 ms. With the flexible transition times, various shapes of pulses can be obtained for applications where parameters such as linearity, switching times or reflection times must be analyzed. Operational amplifiers slew rate can be measured or thresholds of devices and circuits can be easily tested using programmable rise and fall times.

Fast and Easy Operation
To make operation easy, GP1612 interfaces with the operator in a straightforward manner by which the front panel display always shows the parameter being varied and its value. If a new parameter just entered is not compatible with the existing setup status, the operator is informed by an error message. Test setups, up to 99 locations, can be stored and recalled. This feature allows simple test sequence development as well as no need for a controller in repetitive tests, with reduced bus traffic in ATE applications. Last user setup is also retained at power down.


  • Automatic Test Equipment (ATE)
  • Avionics testing
  • Radar testing
  • HP8112A obsolescence replacement