53 GHz VNA RF test performance
High-performance digital, mixed-signal, and RF semiconductor test capabilities
Integrated semiconductor test platform - open architecture
Intel® mini-PC featuring 11th Generation Core Processor
Hosts any two of the GT5150 I/O modules
Increase test rate to 100 MHz
Programmable levels and thresholds with tristate control
PECL to TTL and TTL to PECL
1' SCSI Cable
18 inch harness, 25 pin DSUB , male to male
Comprehensive suite of software tools for semiconductor test applications