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Results for 'ts 900'

Results for 'ts 900'

Showing 1 - 19 of 19 Items

New Product

TS-900e-5G

TS-900e-5G

53 GHz VNA RF test performance

mmWave / 5G PXIe Production Test System

New Product

TS-900e-5G Series

TS-900e-5G Series

53 GHz VNA RF test performance

mmWave 5G PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin PMU

New Product

TS-960e Series

TS-960e Series

High-performance digital, mixed-signal, and RF semiconductor test capabilities

PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin Timing & PMU, 64 Static Digital channels, 0-20V, 2A User Supply; Includes System Self Test & ATEasy Software License, manipulator ready

TS-900e

TS-900e

Integrated semiconductor test platform - open architecture

Digital Test System configured with 64 Dynamic 100 MHz Digital I/O channels with per pin PMU, 64 Static Digital channels, +/- 20 V, 4 ch. user supply, and a receiver interface. System also includes system self test, ATEasy software license, monitor, keyboard, mouse, ICEasy and DIOEasy.

TS-900e Series

TS-900e Series

Integrated semiconductor test platform - open architecture

PXI Semiconductor Test System configured with 64 Dynamic Digital I/O Channels with Per Pin PMU, 64 Static Digital channels, 0-20V, 2A User Supply, and Receiver Interface. System includes System Self Test, ATEasy Software License, ICEasy and DIOEasy

TS-900e-OM

TS-900e-OM

Integrated semiconductor test platform - open architecture

TS-900 Test System Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, 0-20 V, 2 A User Supply, and a Receiver Interface. System also Include System Self Test, ATEasy Software License, ICEasy, DIOEasy, Monitor, Keyboard, and Mouse with Manipulator and Slide Receiver.

TS-900e-SR

TS-900e-SR

Integrated semiconductor test platform - open architecture

TS-900 Test System Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supply, and a Receiver Interface. System also Includes System Self Test, ATEasy Software License, ICEasy, DIOEasy, Monitor, Keyboard, and Mouse with Slide Receiver, manipulator ready.

TS-900eS

TS-900eS

Integrated semiconductor test platform - open architecture

Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supplyy, and a Receiver Interface. System also Includes System Self Test, ATEasy Software License, ICEasy, and DIOEasy.

TS-900eS-OM

TS-900eS-OM

Integrated semiconductor test platform - open architecture

Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, 0-20 V, 2 A User Supply, and a Receiver Interface. System also Includes System Self Test, ATEasy Software License, ICEasy, DIOEasy, and Slide Receiver.

TS-960e-OPT64

TS-960e-OPT64

64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin

New Product

GX7950 Series

GX7950 Series

Intel® mini-PC featuring 11th Generation Core Processor

mini-Computer Controller Series, Intel i7 Core Processor, 16 GB DDR4

New Product

GX7951

GX7951

Intel® mini-PC featuring 11th Generation Core Processor

11 Gen i7-1165G7 mini-PC

GT5900

GT5900

Hosts any two of the GT5150 I/O modules

I/O Module Carrier (allows one or two GT59X0 I/O Modules to be used with GT25/50-DIO)

GT5920

GT5920

Increase test rate to 100 MHz

100 MHz I/O Module for GT515X. 16 TTL channels at up to 100MHz.

GT5930

GT5930

Programmable levels and thresholds with tristate control

Programmable I/OLevels and Threshold Module

GT5940 Series

GT5940 Series

PECL to TTL and TTL to PECL

PECL I/O Modules for GT515x Cards

GT95032

GT95032

1' SCSI Cable

1 ft. Shielded cable with 68 Pin SCSI connectors

GX91810

GX91810

18 inch harness, 25 pin DSUB , male to male

18 inch harness, 25 pin male / male connectors on each end

ICEasy Test Suite

ICEasy Test Suite

Comprehensive suite of software tools for semiconductor test applications

ICEasy Test Suite

Showing 1 - 19 of 19 Items

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About Marvin Test Solutions

Marvin Test Solutions, a vertically-integrated aerospace test and measurement company, has created and delivered innovative, reliable test systems for factory, depot, intermediate, and flightline use since 1988. Our expertise delivering aerospace precision underpins our manufacturing solutions, enabling us to quickly meet customers’ requirements with high-performance products and custom turnkey systems, backed by excellent long-term customer support.

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