Simplified Test Development, Faster Time to Market - August 2025

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Unrivaled Semiconductor Test Capabilities

GENASYS Semi is the most advanced open-architecture semiconductor test platform in the industry, delivering features and capabilities once only found in proprietary “big iron” ATE systems.  GENASYS Semi’s flexible, compact design simplifies installation and startup without compromising speed, measurement performance, or uptime.

It features seamless compatibility with popular wafer probers and device handlers, utilizes single-phase power and air-cooling, and leverages ATEasy Test Executive and Software Development Studio for the lowest overall cost of ownership in its class.

The modular, open-system design philosophy allows the system to grow with the customer, providing headroom to address future test challenges without sacrificing performance. Instrumentation can be easily upgraded at any time, and can be selected for applications ranging from DC to 53 GHz.

GENASYS Semi can be configured with the following capabilities:

  • Dynamic Digital I/O: 64 to 256 channels on RF systems, 64 to 512 channels on baseband systems. Supports multiple timing sets, per pin PMU, and 64M vectors per channel.
  • Device Power Supply (DPS): 16 to 64 independent isolated power supply channels, parallel current ganging, and Kelvin connection sensing.
  • Source Measurement Unit (SMU): 4 to 16 SMU channels with precision four-quadrant operation.

With the smallest footprint among all semiconductor testers, discover how GENASYS Semi sets the benchmark for performance, adaptability, and cost-efficiency in semiconductor testing, from engineering validation to high-volume production.

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