Test Solutions

Aircraft

Weapons Systems

AIM-9 Sidewinder

Maintenance Levels

Aerospace Test System
TS-321 Series

Automotive Test System
TS-322 Series

Satellite Test System
TS-323 Series

Core Test System TS-705	Base Analog/Digital Core Test System TS-710
Core Test System with Boundary Scan TS-720	Mixed Signal Test System TS-730
Digital Test System TS-750	Commercial Avionics Test System TS-770
Military Avionics Test System TS-775

GENASYS

High Performance Mixed Signal Test Platform

GENASYS Benchtop

Compact / Portable Test Platform

Semiconductor Production Test Platform DC - mm Wave 100 MHz Vector Rates TS-900e Series	Semiconductor Production Test Platform DC - mm Wave 125 MHz Vector Rates TS-960e Series	Semiconductor Upgrade / Expansion RF, Analog, Digital MTEK Series
GENASYS Semi Semiconductor Test Platform

Aerospace Test System
TS-321 Series

Automotive Test System
TS-322 Series

Satellite Test System
TS-323 Series

Core Test System TS-705	Base Analog/Digital Core Test System TS-710
Core Test System with Boundary Scan TS-720	Mixed Signal Test System TS-730
Digital Test System TS-750	Commercial Avionics Test System TS-770
Military Avionics Test System TS-775

GENASYS

High Performance Mixed Signal Test Platform

GENASYS Benchtop

Compact / Portable Test Platform

Rugged Field Test Set
MTS-207

SmartCan Universal Hand-held Test Set
MTS-3060C SmartCan

Portable PXI Chassis
GX7600

SmartCan Universal Armament Test Set 3060A SmartCan	Maverick Field Test Set MTS-206A
SmartCan - Maverick AGM-65 MTS-3060A AGM-65	Hellfire / Longbow Test Set AN-TSM-205
SmartCan - AMRAAM AIM-120 MTS-3060A AIM-120	Modular Target Simulator MTS-916
F-35 Armament Test Set MTS-235A	Laser Source Simulator MTS-1888
Common Armament Test Set MTS-209	Hellfire Missile Simulator MT3045

Rugged Field Test Set
MTS-207

Hellfire / Longbow Test Set
AN-TSM-205

Maverick Field Test Set
MTS-206A

Common Armament Test Set
MTS-209

F-35 Armament Test Set
MTS-235A

Commercial

Military

GENASYS Rugged

Adverse Environment Test Platform

Test Executive and IDE ATEasy	Digital I/O Vector Suite DIOEasy	Semiconductor Test Suite ICEasy
Waveform Analysis Suite WaveEasy	LASAR Development Suite DtifEasy	Calibration & Verification CalEasy

Products

Software ATEasy DIOEasy DtifEasy WaveEasy CalEasy ICEasy All Software Products	Chassis & Controllers Chassis Chassis Controllers and Bus Expanders All Chassis and Controllers Products	Digital I/O Dynamic Digital I/O Instrumentation Static Digital I/O Instrumentation Digital I/O Software and Training ROM Emulator Instrumentation JTAG / BDM Instrumentation All Digital I/O Products	Measurement Digital Multimeter Instrumentation Counter Timer Instrumentation Digitizer Instrumentation A/D Converters, Multi-function Instrumentation All Measurement Products	Stimuli Arbitrary Function Generators Standards Source Instrumentation Multi-function Instrumentation D/A Converters and Precision DC Source Instrumentation All Stimulus Products	FPGA Digital I/O Multi-Function All FPGA Products

Switching 3U PXI 6U PXI GENASYS Matrix Multiplexer RF High Current High Density General Purpose All Switching Products	SMUs & Power Supplies Power Supply Mainframe and Modules Instrumentation Precision DC Source Instrumentation All SMUs & Power Supplies Products	Bus Interfaces Bus Expanders GPIB MIL-STD-1553 ARINC 429 Comm All Bus Interfaces Products	GPIB Instrumentation Replacements Wavetek Replacements HP Replacements All GPIB Instrumentation Replacements Products	PXI Instruments Chassis and Controllers Digital I/O Measurement Stimuli FPGA Cards Switching Power Supplies Bus Interfaces All PXI Instruments Products	Legacy GTXI Chassis, Controllers and Instrumentation Digital I/O Stimuli Switching Power Supplies All Legacy Products	Military Missile Launchers All Military Products

Simplified Test Development, Faster Time to Market - August 2025

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Simplified Test Development, Faster Time to MarketFocus OnSolution SpotlightProduct HighlightDid You Know?

Unrivaled Semiconductor Test Capabilities

Endless possibilities from one flexible test platform

Any-Resource to Any-Pin

No compromise signal switching transparency and flexibility

The Test Engineer’s Programming Environment - ATEasy

Unrivaled Semiconductor Test Capabilities

GENASYS Semi is the most advanced open-architecture semiconductor test platform in the industry, delivering features and capabilities once only found in proprietary “big iron” ATE systems. GENASYS Semi’s flexible, compact design simplifies installation and startup without compromising speed, measurement performance, or uptime.

It features seamless compatibility with popular wafer probers and device handlers, utilizes single-phase power and air-cooling, and leverages ATEasy Test Executive and Software Development Studio for the lowest overall cost of ownership in its class.

The modular, open-system design philosophy allows the system to grow with the customer, providing headroom to address future test challenges without sacrificing performance. Instrumentation can be easily upgraded at any time, and can be selected for applications ranging from DC to 53 GHz.

GENASYS Semi can be configured with the following capabilities:

Dynamic Digital I/O: 64 to 256 channels on RF systems, 64 to 512 channels on baseband systems. Supports multiple timing sets, per pin PMU, and 64M vectors per channel.
Device Power Supply (DPS): 16 to 64 independent isolated power supply channels, parallel current ganging, and Kelvin connection sensing.
Source Measurement Unit (SMU): 4 to 16 SMU channels with precision four-quadrant operation.

With the smallest footprint among all semiconductor testers, discover how GENASYS Semi sets the benchmark for performance, adaptability, and cost-efficiency in semiconductor testing, from engineering validation to high-volume production.

Learn More

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Any-Resource to Any-Pin Switching Flexibility

The GENASYS Switching / Digital Subsystem features a hybrid switching architecture that supports a wide range of configurations and topologies while maximizing signal transparency and switching flexibility.

This approach lays the foundation for implementing “any-resource-to-any-pin” functionality, where both analog and digital signals are supported on a per pin basis. Supporting a wide range of digital, high-density, high-current, and RF connections, the receiver can accommodate up to 21 connector slots, as well as over 8,000 connections when fully populated.

Delivering a reliable, “cable-less” connection to the receiver connectors, it eliminates the need for troublesome cable harnesses. This "pull-through” design offers a reliable, high-performance method of connecting switch modules to the mass interconnect receiver, which also improves reliability and greatly simplifies system maintenance.

Don’t compromise, see how GENASYS Switching / Digital Subsystem can deliver the performance and flexibility needed for your most complex test challenges.

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Switching Architecture

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The Test Engineer’s Programming Environment - ATEasy

Designed by test engineers for test engineers, ATEasy combines a full-featured, open architecture software development suite with a customizable test executive to deliver unmatched ease of use, flexibility and productivity.

Development time is significantly reduced with built-in tools, such as the Application Wizard, that helps generate applications quickly and easily using a common application framework and modular structure. And advanced cybersecurity features and protections, including compliance with DOD STIGs, provide a wide range of safeguards for a secure and reliable operating platform.

The royalty-free run-time executables eliminate licensing concerns when distributing test programs to the factory floor or field, ensuring a seamless, trouble-free transition from the test lab to production.

Learn More

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Explore exciting career opportunities at MTS, a premier, vertically-integrated aerospace test and measurement company. Since 1988, we’ve designed and delivered innovative, feature-rich solutions for the world's leading military, aerospace, and manufacturing organizations.

View our current opportunities

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About Marvin Test Solutions

Marvin Test Solutions, a vertically-integrated aerospace test and measurement company, has created and delivered innovative, reliable test systems for factory, depot, intermediate, and flightline use since 1988. Our expertise delivering aerospace precision underpins our manufacturing solutions, enabling us to quickly meet customers’ requirements with high-performance products and custom turnkey systems, backed by excellent long-term customer support.

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888-837-8297 (toll-free)

949-263-2222 (local)

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Aircraft

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Maintenance Levels

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GENASYS Benchtop

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GENASYS

GENASYS Benchtop

Commercial

Military

GENASYS Rugged

Simplified Test Development, Faster Time to Market - August 2025

Unrivaled Semiconductor Test Capabilities

Any-Resource to Any-Pin

The Test Engineer’s Programming Environment - ATEasy

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Unrivaled Semiconductor Test Capabilities

Any-Resource to Any-Pin Switching Flexibility

The Test Engineer’s Programming Environment - ATEasy

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