Description
Supporting your application development is essential for successful completion of your project. Our skilled and experienced engineers are available toassist you with completing your development tasks, software installation, application debugging, instrument control, and integration of your test system.
ATEasy Support entitles users to one year of unlimited support using Marvin Test Solutions'
M@GIC web interface.
The ATEasy support agreement is designed for users that need support but do not have a current support or subscription upgrade agreement.
The MTS support plan provides:
- Unlimited web access support using Marvin Test Solutions' M@GIC web-based interface
- Phone based support
- Help from advanced level support specialists
- Access to our ATEasy engineers and developers
Knowledge Base Articles pertaining to ATEasy Support
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This article will show a simple ATEasy example showing how to peek and flush WinSock buffer data
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The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards.
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This paper explores the ATE cybersecurity issue from the perspective of the test development environment, including the use of test executives, and the challenges associated with minimizing impact to data integrity and access to control, as well as the potential impact on the UUT from substandard counterfeit parts and those embedded with malware.
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Article shows how to change the language for your ATEasy user interface (UI) by using an ATEasy DLL to implement different languages UI. The language of the user interface items such as forms can be changed dynamically while the application is running and based on a user selection. Once the language is selected the language User interface is loaded and used.
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This technical brief offers a notional implementation for replacing the Trendar / Fluke 3050B digital subsystem with a PXI-based, MTS digital subsystem.
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This application note discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost.
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The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. A common test platform and consolidation of test resources facilitates development and long-term support of complex, high-value assemblies.
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This article will go over the details of migration from ATEasy 2.x to ATEasy 9.0. During the process or migration the differences between the two will be discussed.
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Example of modifying HTML Test Log in order to add a new column for a time stamp to the tests tables for MinMax and Other test types.
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Q200301
Nov 10, 2016
White Paper
This paper provides an overview of how ATEasy can be used to support JTAG / 1149.1 based instrument control, programming and test.
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Products similar to ATEasy Support
- ATEasy - Test Executive and Development Studio
- ATEasy 2.0 - ATEasy Test Executive and Development Studio for 16 Bit Applications
- ATEasy Subscription - ATEasy Subscription Renewal
- ATEasy Training - 3 or 5 Day Training at Customer or Marvin Test Solutions Facility
- ATEasy-XX-YY - ATEasy License Type Replacement for ATEasy Subscribers
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