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High-performance digital, mixed-signal, and RF semiconductor test capabilities
Preconfigured, cost effective, functional test solutions for analog, digital, mixed signal and avionics applications
Intel® mini-PC featuring 11th and 13th Generation Core Processors
Supports automated calibration and verification of Marvin Test Solutions instrumentation
Imports, converts and executes IEEE-1445 compliant .tap files from a LASAR simulation for use with MTS digital hardware and digital functional test systems
Import and convert STIL digital vectors (IEEE-1450, Standard Test Interface Language files) to MTS digital vector format
High voltage pin electronics with per channel programmability & PMU pin
May 20, 2024
Enhancements to ATEasy and its software drivers include support for scalable test program development, test execution time optimization, and parallel test support with existing ATEasy test code. Read more...
Mar 9, 2021
The following article discusses the relative merits of two types of multi-site digital semiconductor test system designs. This article focuses on using GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...
Sep 13, 2021
This article demonstrates how to use GX5280/GX5290 Series external events as hardware handshakes to control test pattern execution Read more...
Jul 28, 2023
The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...
May 6, 2021
DioEasy-FIT and GtDio6x-FIT (File Import Toolkit) allows test engineers to easily import STIL, WGL, VCD, EVCD simulation and Teradyne ATP files to DIO or DIO6x files which are used by MTS digital I/O cards. The FIT when coupled with Marvin’s DIOEasy/GTDIO6x vector development / waveform display tools brings a powerful desktop tool set for debugging and developing digital test vectors for all MTS digital instruments without hardware. This article describes how to use the FIT converter tool to convert files. Read more...
Oct 8, 2020
This article demonstrates how to use external events to control test pattern execution Read more...
May 7, 2012
Overview of the PMU API Functions supported by the GX5960 Series Digital Subsystem Read more...
Jun 7, 2011
How to use Pattern Test Flags for Conditional Branching/Halting on Error and Recording Errors Read more...
May 6, 2016
This KB article describes how to import an existing .DTB file to the Marvin Test Solutions GX5960 Digital Subsystem, remap .DTB assigned pin numbers to physical pins, execute the digital burst, and query the instrument for real time compare errors. Read more...
To guarantee good signal quality in a digital environment, it is important to understand when termination is required and the different methods of terminating a transmission line. Read more...
Nov 9, 2016
Sep 6, 2016
Jun 30, 2016
Mar 16, 2012
Sep 29, 2023
Newsletter Section(s): Product Highlight Read more...
Dec 15, 2022
Dec 22, 2021
Newsletter Section(s): Solution Spotlight Read more...
Jun 14, 2019
Dec 1, 2016
Newsletter Section(s): Product Highlight; In The News Read more...
Newsletter Section(s): In The News Read more...
Dec 11, 2014
Feb 19, 2013
Newsletter Section(s): Focus On Read more...
Aug 24, 2012
Newsletter Section(s): Did You Know Read more...
Jun 29, 2012
Apr 26, 2012
Mar 13, 2012
Newsletter Section(s): Product Highlight; Solution Spotlight Read more...
Nov 1, 2011
Aug 30, 2011
Newsletter Section(s): Focus On; Solution Spotlight Read more...
Dec 14, 2010
Oct 20, 2010
Newsletter Section(s): Focus On; Product Highlight Read more...
Sep 7, 2010
