Knowledge Base - White Paper

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Presentation: Leveraging the PXI Modular Architecture for Semiconductor ATE Platforms

This presentation focuses on the benefits of the PXI platform for semiconductor test applications.

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Showing 1 - 10 of 59 Items | 1 2 3 4 5 > | View All
Q200303

Nov 29, 2016
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White Paper: Presentation: Leveraging the PXI Modular Architecture for Semiconductor ATE Platforms

This presentation focuses on the benefits of the PXI platform for semiconductor test applications. Read more...

Q200302

Nov 15, 2016
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Combat Helicopters and Armament Test

This paper examines the evolution of rotary wing aircraft and the challenges of ensuring readiness of their mission-critical armament systems. Read more...

Q200301

Nov 10, 2016
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White Paper: Using IEEE 1149.1-2013 (JTAG) with ATEasy

This paper provides an overview of how ATEasy can be used to support JTAG / 1149.1 based instrument control, programming and test. Read more...

Q200300

Sep 26, 2016
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White Paper: The Future Direction of Test, Maintenance, and Instrumentation – A Supplier’s Perspective

This presentation focuses on current and future trends and challenges for the Test and Measurement industry Read more...

Q200299

Sep 21, 2016
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White Paper: Legacy Test Systems - Replace or Maintain

This paper reviews the various options available to test engineers when faced with replacing or maintaining a test system. Read more...

Q200297

Jun 28, 2016
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White Paper: Modernizing Legacy Automated Test Systems for DoD Depots

This paper reviews the requirements and issues associated with depot ATS equipment and will present a technical strategy for the modernization of Automated Test Systems at Tobyhanna Army Depot. Read more...

Q200295

May 24, 2016
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White Paper: PXI-Based, Advanced Switching Architecture for Functional Test

This white paper describes the advantages of leveraging the 6U PXI architecture and employing advanced signal routing topologies to create modular, high performance switching subsystems. Read more...

Q200289

May 6, 2016

Solution Spotlight: Advanced Digital Testing Using PXI Instrumentation

This article demonstrates the advantages of the flexible, scalable PXI platform's open architecture hardware and software for semiconductor test. Read more...

Q200287

Nov 30, 2015
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White Paper: PXI-Based, High Performance, High Density Switching Architecture

This paper reviews current switching architectures employed today and discusses the benefits / limitations of current COTS offerings. Read more...

Q200286

Nov 30, 2015
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White Paper: Leveraging Open Architecture, Modular Test Platforms for ATE

Presentation: Presented at the corporate forum, International Test Conference 2015 Read more...

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