Knowledge Base - White Paper

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Metal-Oxide (MOX) Gas Sensor Testing

This application note discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor t...

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Q200313

Apr 13, 2018
White Paper

White Paper: Metal-Oxide (MOX) Gas Sensor Testing

This application note discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost. Read more...

Q200308

Sep 22, 2017
White Paper

White Paper: Implementing Digital Interfaces with User Programmable FPGAs

This paper will provide an overview of present day digital test interface requirements with a focus on serial digital interfaces which have become increasingly common for the control and monitoring of electronic modules and systems. Read more...

Q200303

Nov 29, 2016
White Paper

White Paper: Presentation: Leveraging the PXI Modular Architecture for Semiconductor ATE Platforms

This presentation focuses on the benefits of the PXI platform for semiconductor test applications. Read more...

Q200302

Nov 15, 2016
White Paper

Combat Helicopters and Armament Test

This paper examines the evolution of rotary wing aircraft and the challenges of ensuring readiness of their mission-critical armament systems. Read more...

Q200301

Nov 10, 2016
White Paper

White Paper: Using IEEE 1149.1-2013 (JTAG) with ATEasy

This paper provides an overview of how ATEasy can be used to support JTAG / 1149.1 based instrument control, programming and test. Read more...

Q200300

Sep 26, 2016
White Paper

White Paper: The Future Direction of Test, Maintenance, and Instrumentation – A Supplier’s Perspective

This presentation focuses on current and future trends and challenges for the Test and Measurement industry Read more...

Q200299

Sep 21, 2016
White Paper

White Paper: Legacy Test Systems - Replace or Maintain

This paper reviews the various options available to test engineers when faced with replacing or maintaining a test system. Read more...

Q200297

Jun 28, 2016
White Paper

White Paper: Modernizing Legacy Automated Test Systems for DoD Depots

This paper reviews the requirements and issues associated with depot ATS equipment and will present a technical strategy for the modernization of Automated Test Systems at Tobyhanna Army Depot. Read more...

Q200295

May 24, 2016
White Paper

White Paper: PXI-Based, Advanced Switching Architecture for Functional Test

This white paper describes the advantages of leveraging the 6U PXI architecture and employing advanced signal routing topologies to create modular, high performance switching subsystems. Read more...

Q200289

May 6, 2016

Solution Spotlight: Advanced Digital Testing Using PXI Instrumentation

This article demonstrates the advantages of the flexible, scalable PXI platform's open architecture hardware and software for semiconductor test. Read more...

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