Knowledge Base - White Paper

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Solving Functional Test Obsolescence

This paper provides an overview of how MTS' GENASYS functional test system can successfully address both current and future test needs that are presently supported by legacy functional test platforms.

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Showing 1 - 10 of 67 Items | 1 2 3 4 5 > | View All
Q200323

Oct 16, 2019

Countering Cybersecurity and Counterfeit Material Threats in Test Systems

This paper explores the ATE cybersecurity issue from the perspective of the test development environment, including the use of test executives, and the challenges associated with minimizing impact to data integrity and access to control, as well as the potential impact on the UUT from substandard counterfeit parts and those embedded with malware. Read more...

Q200260

Oct 10, 2019
White Paper

White Paper: Solving Functional Test Obsolescence

This paper provides an overview of how MTS' GENASYS functional test system can successfully address both current and future test needs that are presently supported by legacy functional test platforms. Read more...

Q200325

Sep 5, 2019

The PXI Standard – A Summary of Updates and Enhancements to the PXI Specifications

This paper reviews the specific details and rationale associated with the revisions made to seven of the specifications which are maintained by the PXI Systems Alliance (PXISA). Read more...

Q200324

Sep 5, 2019

Addressing ATE Instrument Obsolescence with Form / Fit / Function Compatible Solutions – A Case Study

This paper discusses how the use of a form / fit / function instrument replacement solution was employed for replacing pulse and arbitrary waveform function generators that are part of the Hybrid Test Set (HTS) AN/USM-484 test system. Read more...

Q200255

May 24, 2019
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White Paper: Modernizing Military Flightline Test Sets With the MTS-207

The PATS (Portable Automated Test Set)-70 is a flightline test set that is based on the MTS-207 for supporting and maintaining a variety of A-10/C systems. Read more...

Q200284

May 24, 2019
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White Paper: Target Simulators for Modern Munitions

The quest for commonality, capability and long term sustainment of armament test equipment for optically guided smart weapons Read more...

Q200320

Sep 25, 2018
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White Paper: Leveraging Industry Standards for User Programmable FPGA Instrumentation

This paper discusses the use of industry standard design tools, the proper use of intellectual property (IP), and the use/adoption of standardized FPGA interfaces such as the ANSI/VITA 57 standard. Read more...

Q200319

Sep 25, 2018
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White Paper: Next Generation Armament Test Solutions for the Flightline

This paper provides an overview of flightline armament testers and presents key features of a next generation flightline tester that is capable of supporting multiple aircraft platforms and weapon systems as well as being upgradeable for future test needs. Read more...

Q200312

Jul 23, 2018

Consolidating Test Resources for Avionics Production Test

The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. A common test platform and consolidation of test resources facilitates development and long-term support of complex, high-value assemblies. Read more...

Q200315

Jun 4, 2018
White Paper

White Paper: Metal-Oxide (MOX) Gas Sensor Testing

The application of MEMS technology has allowed Metal Oxide (MOX) Gas Sensors to be mass-produced at the wafer level with silicon wafer manufacturing offering cost reduction and scalability to large volumes. This white paper discusses how a semiconductor manufacturer of Gas Sensors employed a focused test solution that provided the required accuracy, accommodated very large site counts, and matched the over-all throughput performance of high performance semiconductor test systems at a much lower cost. Read more...

Showing 1 - 10 of 67 Items | 1 2 3 4 5 > | View All