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Available as a bench top system or with an integrated manipulator, the TS-960 takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
Results from Test Solutions and Products PXIe 3U New Product View TS-960e TS-960e High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconductor Test System with Timing per Pin Digital Subsystem PXIe 3U New Product View TS-96...
TS-960-OM TS-960-OM.
Search Results For: "TS 960 OPT64" | Marvin Test Solutions, Inc. Sign In Cart Test Solutions Aircraft F-15 F-16 F/A-18 F-35 AH-64 Remotely Piloted Aircraft (RPA) Weapons Systems AGM-65 Maverick AGM-114 Hellfire GBU-xx Paveway AIM-9 Sidewinder Mainten...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e Series TS-960e Series High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin Timing &...
The TS-960 brings the performance and features of high-end systems to customers at a fraction of the footprint and with outstanding value compared to traditional ATE. “Our semiconductor customers asked for an alternative to big-iron ATE systems that would comb...
TS-960e SERIES Page 1 MANUFACTURING SEMICONDUCTOR PRODUCTION TEST PLATFORM 21-slot, PXI Express architecture provides high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint • Industry leading digital subsystem o...
The TS-960e features a handler compatible slide receiver, which offers the flexibility to interface to virtually any device handler. In addition, fixture compatibility is maintained with both the TS-900 and TS-960 test systems, allowing users to interchange lo...
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Shielded cable with 68 Pin SCSI connectors View GtDio6x-FIT GtDio6x-FIT Import and convert STIL digital vectors (IEEE-1450, Standard Test Interface Language files) to MTS digital vector format Digital File Import Tool Option for GX5296/GX5960 DIO View GtDio6x-...
The TS-960e-5G is the ideal test solution for semiconductor OEMs, fabless semiconductor vendors, incoming inspection / counterfeit detection labs and packaging / test vendors needing a cost-effective, configurable mmWave test system.
The TS-960e is a flexible, open-architecture semiconductor test solution which offers PXI Express performance and digital, mixed-signal and RF test capabilities in a compact, single-chassis footprint.
If you cannot find what you are looking for feel free to Contact Us. Results from Test Solutions and Products PXIe 3U New Product View TS-960e Series TS-960e Series High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconduct...
Search Results For: "PXIE SEMICONDUCTOR TEST SYSTEM TS 960E TS 960E SERIES" | Marvin Test Solutions, Inc. Sign In Cart Test Solutions Aircraft F-15 F-16 F/A-18 F-35 AH-64 Remotely Piloted Aircraft (RPA) Weapons Systems AGM-65 Maverick AGM-114 Hellfir...
The TS-960e-5G offers users a compact test system that can support both functional and DC parametric test capabilities. It is available with 5G software tools and with a digital vector conversion utility that supports ASCII, WGL, STIL, VCD, eVCD and ATP vector...
Available as a bench top or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for digital, mixed – signal or RF test applications.
Results from Test Solutions and Products PXIe 3U New Product View TS-960e-5G TS-960e-5G mmWave Device Production Test and Characterization mmWave / 5G PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin PMU Results from Downloads TS960...
The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.
Qty TS-960e-OPT64 64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin View required/recommended products Call for Pricing *Valid Quantity Required Required / Recommended Products No Required/Recommended Products Found ATEasy Licens...
System also Includes System Self Test, ATEasy Software License, ICEasy, DIOEasy, and Slide Receiver. PXI 3U View TS-960e-OPT64 TS-960e-OPT64 64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin New Product View GX7950 Series GX7950 ...
High-performance digital, mixed-signal, and RF semiconductor test capabilities
Preconfigured, cost effective, functional test solutions for analog, digital, mixed signal and avionics applications
Intel® mini-PC featuring 11th Generation Core Processor
Supports automated calibration and verification of Marvin Test Solutions instrumentation
Imports, converts and executes IEEE-1445 compliant .tap files from a LASAR simulation for use with MTS digital hardware and digital functional test systems
Connector Interface for GT5xxx/GX5xxx/GC5xxx Products
Connector Interface for all 5xxx/35xx Products
Import and convert STIL digital vectors (IEEE-1450, Standard Test Interface Language files) to MTS digital vector format
May 20, 2024
Enhancements to ATEasy and its software drivers include support for scalable test program development, test execution time optimization, and parallel test support with existing ATEasy test code. Read more...
Mar 9, 2021
The following article discusses the relative merits of two types of multi-site digital semiconductor test system designs. This article focuses on using GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...
Sep 13, 2021
This article demonstrates how to use GX5280/GX5290 Series external events as hardware handshakes to control test pattern execution Read more...
Jul 28, 2023
The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...
May 6, 2021
DioEasy-FIT and GtDio6x-FIT (File Import Toolkit) allows test engineers to easily import STIL, WGL, VCD, EVCD simulation and Teradyne ATP files to DIO or DIO6x files which are used by MTS digital I/O cards. The FIT when coupled with Marvin’s DIOEasy/GTDIO6x vector development / waveform display tools brings a powerful desktop tool set for debugging and developing digital test vectors for all MTS digital instruments without hardware. This article describes how to use the FIT converter tool to convert files. Read more...
Oct 8, 2020
This article demonstrates how to use external events to control test pattern execution Read more...
May 7, 2012
Overview of the PMU API Functions supported by the GX5960 Series Digital Subsystem Read more...
Jun 7, 2011
How to use Pattern Test Flags for Conditional Branching/Halting on Error and Recording Errors Read more...
May 6, 2016
This KB article describes how to import an existing .DTB file to the Marvin Test Solutions GX5960 Digital Subsystem, remap .DTB assigned pin numbers to physical pins, execute the digital burst, and query the instrument for real time compare errors. Read more...
To guarantee good signal quality in a digital environment, it is important to understand when termination is required and the different methods of terminating a transmission line. Read more...
Nov 9, 2016
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Sep 29, 2023
Newsletter Section(s): Product Highlight Read more...
Dec 15, 2022
Dec 22, 2021
Newsletter Section(s): Solution Spotlight Read more...
Jun 14, 2019
Dec 1, 2016
Newsletter Section(s): Product Highlight; In The News Read more...
Newsletter Section(s): In The News Read more...
Dec 11, 2014
Feb 19, 2013
Newsletter Section(s): Focus On Read more...
Aug 24, 2012
Newsletter Section(s): Did You Know Read more...
Jun 29, 2012
Apr 26, 2012
Mar 13, 2012
Newsletter Section(s): Product Highlight; Solution Spotlight Read more...
Nov 1, 2011
Aug 30, 2011
Newsletter Section(s): Focus On; Solution Spotlight Read more...
Dec 14, 2010
Oct 20, 2010
Newsletter Section(s): Focus On; Product Highlight Read more...
Sep 7, 2010
