Welcome to the August 2020 issue of Test Connections – wow, what a year 2020 has been so far! We hope you and your families are staying healthy and safe. MTS continues to operate uninterrupted and virus-free due to our team’s diligence following best practices to avoid contracting and spreading COVID-19. We remain “Open for Business” and stand ready to assist meeting your test and measurement requirements. In fact, we are having one of the busiest years in our history.
In this issue you will see why our solutions are in high demand as we describe the advanced features of the MTS-235A F-35 Armament Test Set that make the test, maintenance, and sustainment of AME & AAE easy for F-35 maintainers. In addition, we showcase our TS-900e to test 5G mmWave semiconductor chips. Finally, we introduce a great new PXI product, the GX3748 48-Channel Threshold Comparator Card.
The entire MTS Team joins me in wishing you a healthy and secure environment until we meet again online, in a meeting room, or on the show floor. We hope you’ll join us September 14 – 16 at the booth we will be supporting at the AFA’s virtual Air, Space and Cyber Conference. Please contact Jessica DeLaTorre to set up a meeting as the time slots are going fast.
Best regards,
Stephen T. Sargeant
Major General, USAF (Ret.)
CEO
We hope you enjoy this month's issue of Test Connections which includes new product updates and news events.
Please send your comments or suggestions regarding this newsletter to marketing@MarvinTest.com.
MTS-235A Supports F-35 Armament Test | | | | | The MTS-235A is a state-of-the-art, proven Production and Depot-Level test set supporting F-35 armament systems globally today. The MTS-235A Test Set was designed with the capabilities needed to serve as the F-35 Intermediate Level Armament Test Set in its portable, ultra-rugged, flightline and backshop qualified case. | |
 Read more
|
MTEK Breathes New Life Into Legacy Semiconductor Test Systems:Read on
to learn more.
Metal Oxide (MOX) Gas Sensor Testing Click here
to learn more.
Would you like to receive the Test Connections Newsletters on a regular basis?
You can
sign up
at any time.
Can't find what you're looking for? We'll build it for you. We also customize and
adapt standard catalog products to meet your specific needs. Click here to request more information.
|
MTS-235A Supports F-35 Armament Test
Production, Depot, and Intermediate Level F-35 Armament Test Set
The MTS-235A is a state-of-the-art, proven Production and Depot-Level test set supporting F-35 armament systems globally today. The MTS-235A Test Set was designed with the capabilities needed to serve as the F-35 Intermediate Level Armament Test Set in its portable, ultra-rugged, flightline and backshop qualified case.
The MTS-235A performs parametric functional tests on F-35 Alternate Mission Equipment (AME) including Launchers (iARL and eARL), Pylons (Air-to-Ground and Air-to-Air), associated subassemblies and adapters, with full support for MIL-STD-1760 assemblies and all F-35 interfaces.
The system is currently in use for production testing of F-35 AME and repair by the Marvin Engineering Company, a leader in F-35 AME manufacturing. The USAF is scheduled to begin depot operations in 2020 and the MTS-235A will be an integral part of that operation. The MTS-235A is ready for Intermediate-Level use if the F-35 adopts 3-Level maintenance.
| |
Field Proven and Easy to Use
Test capabilities and ease-of-use features:- Removable, integrated LCD touch screen Remote Control & Display Unit (RCDU)
- Ultra-rugged construction permits use in adverse environments found at home station and deployed.
- Menu-driven design simplifies operation, reduces training time, and eliminates the need to refer to cumbersome Tech Orders during operation. A menu-driven structure, developed using the cybersecure ATEasy® Test Executive and Development Studio, guides the user and creates an environment that virtually eliminates operator errors.
- Cable detection is automatic and prevents connection errors.
- Cables incorporate ‘connector savers’, prolonging the useful life of cables with sensitive contact types like twinax and coax. Connector savers can be easily replaced without having to repair cables.
- Add-on compressor unit available to conduct off-aircraft testing of BRU-67, BRU-68, and Air-to-Ground Pylon (AGP) pneumatics.
The design of the MTS-235A is based on the proven and widely fielded MTS-207 Ultra-rugged Test Set, deployed in over 20 countries providing the baseline architecture for the MTS-206 Maverick Field Test Set, MTS-209 Common Armament Test Set, AN/TSM-205B Hellfire System Test Set, and USAF’s PATS-70 and PATS-70A A-10C Test Sets. The ultra-rugged and modular PXI-based design of the MTS-207 ensures the flexibility and upgradeability needed to support current and future armament and munitions.
To learn more about the advanced features that streamline AME maintenance and sustainment for the F-35, view the product information and specifications on our website at www.marvintest.com. |
TS-900e-5G Series mmWave/5G Production Test System
Marvin Test Solutions’ TS-900e-5G Series mmWave test systems deliver proven performance up to 50 GHz. Two system configurations are available, offering users the option to select a system with PXIe and/or LXI instrumentation to suit their test requirements.
Both systems can be configured with up to 256 dynamic digital channels. The digital subsystem uses the GX5295 or the GX5296 - 3U PXI, 32 channel, 100/125 MHz digital I/O cards with per channel parametric measurement units (PMUs). A wide range of digital and analog instrument options can easily be incorporated into the TS-900e-5G systems for supporting both functional and DC parametric test capabilities. RF instrumentation options include the Keysight M9807 / M9808 PXIe VNA or the Rohde and Schwarz ZNBT40 LXI instruments.
Both systems offer a total of 20 PXI / PXIe peripheral slots which can accommodate additional digital and analog test resources. In addition, MTS offers a full suite of digital and parametric test capabilities as well as SPI/I2C interface support for controlling / monitoring the device under test (DUT).
|  |
TS-900e-5G
The TS-900e-5G incorporates high-performance PXIe RF instrumentation with a 53 GHz receiver interface for production or characterization of packaged or wafer test of mmWave devices. The TS900e-5G provides up to 20 independent 53GHz VNA ports, 256 digital I/O channels, and up to 16 device power supplies and can support quad-site production testing.
The manipulator/handler ready TS-900e-5G's compact footprint is the ideal test solution for production semiconductor OEMs, device verification, incoming inspection, wafer probing and packaging / test vendors needing a cost-effective, configurable mmWave test system.
TS-900e-5G
|
TTS-900eX-5G
For multi-site test applications requiring expanded port and instrumentation needs, the TS-900eX-5G offers an expanded digital and RF port count and the option to incorporate both PXI and LXI instrumentation.
TS-900eX-5G
System software includes DIOEasy for digital waveform editing / display, ICEasy for device test development, and Marvin Test Solutions' ATEasy® which provides an integrated and complete test executive and test development environment, allowing users to quickly develop and easily maintain test applications.
For more information including detailed product specifications, visit our website or contact our semiconductor test experts today.
|
New GX3748 Series 48-Channel Threshold Comparator Card Delivers Exceptional Event Monitoring Capability
Exceptional Capability with FPGA Configurability
Marvin Test Solutions’ new GX3748 combines 48 voltage comparator channels with windowing and precision level detection, to deliver the ideal event monitoring and control solution. Triggers can be generated, based on user programmable voltage threshold levels, enabling time-critical response when out-of-limit test conditions occur.
The GX3748 is a user configurable, FPGA-based, 3U PXI card. The daughter board interfaces to the GX3700 FPGA baseboard which employs the Altera Stratix III FPGA. Each input channel can accept input voltage signals from 0 to 50 volts, with programmable threshold levels. Three of the 48 channels are supported by the board's timestamp event feature.
| |
No-Compromise Features
The GX3748 Series is the ideal solution for applications requiring simultaneous monitoring of 10’s to 100’s of channels, coupled with the ability to respond rapidly when an event occurs. The ability to modify the instrument’s functionality, utilizing user programmable FPGA tools, further extends the no-compromise features of this card.
Additionally, multiple high-density comparator cards can easily be combined in a single chassis without sacrificing performance or system response time, expanding monitoring capacity to many hundreds of channels.
The GX3748 Series is also available in a ruggedized, conformally coated version (GX3748-M) for use in harsh environments.
To learn more about Marvin Test Solutions’ suite of PXI/PXIe user-programmable FPGA modules that offer users the flexibility to create high performance, customized digital and mixed signal instrumentation for specific applications without requiring the use of external interface cards, visit https://www.marvintest.com/Category/FPGA.
|
Newsworthy Happenings at Marvin Test Solutions
Trade Show News
Our usually busy trade show calendar has been challenged this year with the cancellation or rescheduling of many shows we had planned to attend. Others have been transformed into virtual events, with conference sessions, virtual "booths" and online meeting opportunities for participants. We look forward to virtually meeting with you at our next event, the Air Force Association's virtual Air, Space & Cyber Conference (vASC).
To arrange a meeting in advance, contact Jessica at: Jessica.DeLaTorre@MarvinTest.com. A meeting scheduler and chat function will also be available during the event. Here are the details: | 
|
AFA Air, Space & Cyber ConferenceSep 14 - 16, 2020The Air Force Association’s Air, Space & Cyber Conference is going virtual this year. The nation's premier event for defense and aerospace professionals from across the United States and abroad, AFA’s virtual Air, Space & Cyber Conference (vASC) will continue AFA’s long tradition of hosting the premier event for defense and aerospace professionals around the world. The conference will offer the same exceptional line-up of speakers, world-class (virtual) exhibits, professional development opportunities, and important interaction between and among industry, government, the media, academia, and the public.
|
Connect With Us!
Connect with MTS on social media (LinkedIn, Twitter, Instagram, and Facebook) to learn more about how We Make Test Easy™, and visit our YouTube channel to view our latest videos.
Marvin Test Solutions' COVID-19 Statement
MTS is Open for Business. Please note that MTS is exempt from the State-wide “Stay At Home” Executive Order issued by California Governor Newsom. MTS is part of the “Federal Critical Infrastructure Sector” and we have taken precautions to ensure the health and safety of the MTS team, while we remain committed to providing our customers with the unrivaled service and support we are known for. Contact us to discuss your test requirements, or learn more about our COVID-19 response here.
Recent Articles
Evaluation Engineering - July 29, 2020
Special Report: Communications Test
Evaluation Engineering - May 29, 2020
Leveraging modularity from measurement hardware to DFT software
Orange County Business Journal - May 11, 2020
Marvin Test Solutions Moves Ahead with Military Work
Electronic Product Design & Test - May 1, 2020
The evolving PXI standard: expanding the capabilities of the PXI architecture
Evaluation Engineering - Feb 26, 2020
Special Report: Power Supplies and Loads
Evaluation Engineering - Jan 1, 2020
Conformance and Cooperation Drive 5G Forward
Press Releases
Aug 25, 2020 Marvin Test Solutions Expands PXI FPGA Product Line
Aug 5, 2020 Marvin Test Solutions Announces New PXI Multifunction Instrument
Jul 22, 2020 Marvin Test Solutions Expands User-Programmable PXI FPGA Product Line
Jun 22, 2020 New PXI Multi-Function Card from Marvin Test Solutions
Jun 19, 2020 Update: Marvin Test Solutions’ Response COVID-19
Apr 27, 2020 Marvin Test Solutions Announces New PXI/PXIe Digitizers
|
MTEK Breathes New Life Into Legacy Semiconductor Test Systems
Semiconductor ATE Obsolescence - Solved
Testing today’s advanced semiconductor devices with yesterday’s ATE is not an option. With each new development in device technology, the test requirements can outpace the capabilities of the available test equipment. The Marvin Test Expansion Kit (MTEK) platform provides the solution.
The new Marvin Test Expansion Kit (MTEK) platform breathes new life into legacy semiconductor test systems with a PXI-based add-on solution that easily adds capability without the expense of replacing the entire system. |  |
A Cost-effective Solution
Why go to the trouble and capital expense of replacing your entire legacy semiconductor ATE, when MTEK can easily add the functionality you need to meet your most demanding test requirements? MTEK allows you to configure the ideal solution with the performance RF, digital and/or analog test capabilities your legacy system lacks.
Get started today. Visit the MTEK product page for specifications and available instrumentation options, or contact MTS for a quote. |
