Test Connections - August 2020

TS-900e-5G Series mmWave/5G Production Test System

Marvin Test Solutions’ TS-900e-5G Series mmWave test systems deliver proven performance up to 50 GHz. Two system configurations are available, offering users the option to select a system with PXIe and/or LXI instrumentation to suit their test requirements.

Both systems can be configured with up to 256 dynamic digital channels. The digital subsystem uses the GX5295 or the GX5296 - 3U PXI, 32 channel, 100/125 MHz digital I/O cards with per channel parametric measurement units (PMUs). A wide range of digital and analog instrument options can easily be incorporated into the TS-900e-5G systems for supporting both functional and DC parametric test capabilities. RF instrumentation options include the Keysight M9807 / M9808 PXIe VNA or the Rohde and Schwarz ZNBT40 LXI instruments.

Both systems offer a total of 20 PXI / PXIe peripheral slots which can accommodate additional digital and analog test resources. In addition, MTS offers a full suite of digital and parametric test capabilities as well as SPI/I2C interface support for controlling / monitoring the device under test (DUT).

TS-900e-5G Series
The TS-900e-5G incorporates high-performance PXIe RF instrumentation with a 53 GHz receiver interface for production or characterization of packaged or wafer test of mmWave devices. The TS900e-5G provides up to 20 independent 53GHz VNA ports, 256 digital I/O channels, and up to 16 device power supplies and can support quad-site production testing.

The manipulator/handler ready TS-900e-5G's compact footprint is the ideal test solution for production semiconductor OEMs, device verification, incoming inspection, wafer probing and packaging / test vendors needing a cost-effective, configurable mmWave test system.



For multi-site test applications requiring expanded port and instrumentation needs, the TS-900eX-5G offers an expanded digital and  RF port count and the option to incorporate both PXI and LXI instrumentation.



System software includes DIOEasy for digital waveform editing / display, ICEasy for device test development, and Marvin Test Solutions' ATEasy® which provides an integrated and complete test executive and test development environment, allowing users to quickly develop and easily maintain test applications.

For more information including detailed product specifications, visit our website or contact our semiconductor test experts today.