Search Results - PXI Semiconductor Test System TS 900 TS 900 Series

Search Results For: "PXI SEMICONDUCTOR TEST SYSTEM TS 900 TS 900 SERIES" | Marvin Test Solutions, Inc. Sign In Cart Test Solutions Aircraft F-15 F-16 F/A-18 F-35 AH-64 Remotely Piloted Aircraft (RPA) Weapons Systems AGM-65 Maverick AGM-114 Hellfire G...

PXI 3U View TS-900eS TS-900eS Integrated semiconductor test platform - open architecture Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supply...

PXI 3U View TS-900eS TS-900eS Integrated semiconductor test platform - open architecture Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supply...

PXI 3U View TS-900eS TS-900eS Integrated semiconductor test platform - open architecture Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supply...

TS-900 PXI Semiconductor Test System - Vote For Best In Test Award - User Forums » Products » Other | Marvin Test Solutions, Inc. Sign In Cart Test Solutions Aircraft F-15 F-16 F/A-18 F-35 AH-64 Remotely Piloted Aircraft (RPA) Weapons Systems AGM-65 Maverick A...

PXI 3U View TS-900eS TS-900eS Integrated semiconductor test platform - open architecture Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supply...

PXI 3U View TS-900eS TS-900eS Integrated semiconductor test platform - open architecture Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 ch. user supply...

The manipulator's spring loaded design allows for easy alignment and docking to handlers – eliminating the need for a complex receiver interface. “By adding this configuration option to the TS-900, we are able to address a wider range of applications and p...

With an additional 14 PXI slots available for adding more digital or analog test resources as needed, the TS-900 is the ideal test solution for semiconductor OEMs, fabless semiconductor vendors, incoming inspection / counterfeit detection labs and packaging / ...

Results from Test Solutions and Products PXI 3U View TS-900e Series TS-900e Series Integrated semiconductor test platform - open architecture PXI Semiconductor Test System configured with 64 Dynamic Digital I/O Channels with Per Pin PMU, 64 Static Digital chan...

With the advent of these new, advanced digital subsystems, PXI–based semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities and features for digital, mixed-signal and RF test applications.

The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.

The TS-900 is available in both bench top or cart configurations – providing additional flexibility for laboratory or production floor applications. Pricing and Availability: The TS-900 is available now , with the base system priced at less than $75K USD.

The test system incorporates a high power (60 watts per slot), 21-slot, PXIe chassis and a custom-designed, performance test interface that supports the use of PCB DUT (Device Under Test) boards - a proven and high-performance method for interfacing to the dev...

Results from Test Solutions and Products PXI 3U View TS-900e Series TS-900e Series Integrated semiconductor test platform - open architecture PXI Semiconductor Test System configured with 64 Dynamic Digital I/O Channels with Per Pin PMU, 64 Static Digital chan...

If you cannot find what you are looking for feel free to Contact Us. Results from Test Solutions and Products PXIe 3U New Product View TS-900e-5G TS-900e-5G 53 GHz VNA RF test performance mmWave / 5G PXIe Production Test System PXIe 3U New Product View TS-900e...

Available as a bench top, with an integrated cart, or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for device, SoC and SiP test applications.

Results from Test Solutions and Products PXI 3U View TS-900e-SR TS-900e-SR Integrated semiconductor test platform - open architecture TS-900 Test System Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 2...

This paper provides and overview of how new, advanced PXI digital subsystems can address semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities for digital, mixed-signal and RF test applications. Read more...

This paper provides and overview of how new, advanced PXI digital subsystems can address semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities for digital, mixed-signal and RF test applications. Read more...

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Capable of supporting up to 20 independent VNA ports, these systems are ideal for applications requiring parallel, multi-site test capabilities. Keysight Technologies modular vector network analyzers (VNAs) are at the heart of the TS-900e-5G, delivering except...

In addition, these PXI test systems, such as Marvin Test Solutions' TS-900 are providing test engineers cost-effective ATE that can be used for failure analysis, prototype device verification, and pilot / early production runs – allowing the “big iron” ATE...

Test Solution Categories Semiconductor Test Systems Production Test Systems Bench Top Test Systems Industrial Test Systems Semiconductor Test Systems Semiconductor test solutions for digital and mixed-signal test applications View TS-900e-5G Series TS-900e-5G ...

TS-900 uses Geotest's semiconductor test instrumentation which can be augmented by industry standard PXI instruments to test most device types, providing a low cost, configurable test platform for characterization or full production test of devices when in...