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TS-900-OM TS-900-OM TS-900-OM.
TS-900eS-OM Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, 0-20 V, 2 A User Supply, and a Receiver Interface. System also Includes System Self Test, ...
PXI 3U View TS-900eS TS-900eS Integrated semiconductor test platform - open architecture Digital Test System, Slave configuration, Configured with 64 Dynamic 100 MHz Digital I/O Channels with per pin PMU, 64 Static Digital Channels, +/- 20 V, 4 c...
TS-900 Series TS-900 Series.
TS-900 are providing test engineers cost-effective ATE that can be used for failure analysis, prototype device verification, and pilot / early production runs – allowing the ...'>In addition, these PXI test systems, such as Marvin Test Solutions' TS-900 are providing test engineers cost-effective ATE that can be used for failure analysis, prototype device verification, and pilot / early production runs – allowing the ...
This paper provides and overview of how new, advanced PXI digital subsystems can address semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities for digital, mixed-signal and RF test applications. Read ...
Results from Test Solutions and Products PXI 3U View TS-900e Series TS-900e Series Integrated semiconductor test platform - open architecture PXI Semiconductor Test System configured with 64 Dynamic Digital I/O Channels with Per Pin PMU, 64 Stati...
TS-900 Load Board Design Considerations The signal routing for the digital traces and any digital signal or component should be routed over the digital power plane on the top signal layer, while any analog signal traces or analog component...
Our expertise delivering aerospace precision underpins our manufacturing solutions, enabling us to quickly meet customers' requirements with high-performance products and custom turnkey systems, backed by excellent long-term customer support.
The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.
The Reid-Ashman OM1069 manipulator is designed specifically for the TS-900 and allows precise positioning and flexibility for interfacing to automated probers and device handlers used for production testing of semiconductor devices.
TS-900 PXI Semiconductor Test System - Vote For Best In Test Award - User Forums » Products » Other | Marvin Test Solutions, Inc. Sign In Cart Test Solutions Aircraft F-15 F-16 F/A-18 F-35 AH-64 Remotely Piloted Aircraft (RPA) Weapons Systems AGM...
TS-900S TS-900S.
TS-960-OM TS-960-OM.
Reid-Ashman OM-1069 and inTest manipulators are also supported. TS-900e-5G Test System with manipulator Compact footprint, reduced power consumption and standard air cooling further contribute to the overall lower cost of ownership and reduced ca...
The software supplied with the TS-900 includes Geotest's DIOEasy for digital waveform editing / display and ATEasy which provides an integrated and complete test executive and test development environment, allowing users to quickly develop an...
The TS-900e-5G series is part of Marvin Test Solutions' GENASYS Semi suite of semiconductor test systems that offer exceptional quality, value, and flexibility for packaged and wafer device test / characterization, pilot production and focused produ...
TS-900 Manipulator Read more Using the GX5295's Level Comparators for Fast Go/No- Go Device Testing The GX5295 provides dual input level comparators for fast validation of a semiconductor's DC parameters.
53 GHz VNA RF test performance
High-performance digital, mixed-signal, and RF semiconductor test capabilities
Integrated semiconductor test platform - open architecture
Intel® mini-PC featuring 11th Generation Core Processor
Hosts any two of the GT5150 I/O modules
Programmable levels and thresholds with tristate control
PECL to TTL and TTL to PECL
20 slots supporting one 6U or 3U (embedded or remote) PXI controller and 19 PXI or cPCI instruments (3U or 6U)
18 inch harness, 25 pin DSUB , male to male
Comprehensive suite of software tools for semiconductor test applications
Apr 12, 2024
SemiEasy is a drop-in user interface designed to provide common semiconductor test features without requiring extensive configuration. Read more...
May 20, 2024
Enhancements to ATEasy and its software drivers include support for scalable test program development, test execution time optimization, and parallel test support with existing ATEasy test code. Read more...
May 6, 2016
This article demonstrates the advantages of the flexible, scalable PXI platform's open architecture hardware and software for semiconductor test. Read more...
Nov 30, 2015 White Paper
Presentation: Presented at the corporate forum, International Test Conference 2015 Read more...
Oct 13, 2015 White Paper
The next generation of PXI digital instrumentation offers the capabilities and test features normally only found in proprietary ATE semiconductor systems. This paper provides and overview of how new, advanced PXI digital subsystems can address semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities for digital, mixed-signal and RF test applications. Read more...
Sep 26, 2022
This article describes ICEasy add-on module used for Semiconductor test using Marvin Test Solutions DIO boards with PMU Read more...
Jun 1, 2021
Tips and consideration when designing Load board for the TS-900 semiconductor test system Read more...
Jun 17, 2013 White Paper
The PXI architecture and specifically PXI -based systems offers semiconductor test engineers a flexible and modular platform for supporting device verification and focused production test of digital and mixed signal devices. Read more...
Jun 11, 2013
How to use the Shmoo plot tool with ATEasy v9 Read more...
This article explain the effects of IC test socket contamination on contact resistance with different lead platings Read more...
Nov 8, 2011 1 Reply 6917 Views
We are pleased to announce to you that our TS-900 PXI Semiconductor Test System is a contender for the Best in Test Award from Test and Measurement World (publication). ... Read more... 4/23/2015 8:27:05 AM by Olga T.
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Oct 28, 2020 1 Comment
mmWave beamforming devices are essential for implementing phased array and mmWave antennas, and with the emergence of 5G networks the demand for these devices continues to grow. Production test of these devices has been both complicated and slow, especially with the emergence of multi-port beamforming devices (5, 9 and even 17 mmWave ports) designed for 5G NR networks. Read more...
