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The TS-960e-5G is the ideal test solution for semiconductor OEMs, fabless semiconductor vendors, incoming inspection / counterfeit detection labs and packaging / test vendors needing a cost-effective, configurable mmWave test system.
Results from Downloads TS960e5GDS.pdf Jun 4, 2025 version: C 192.18 KB TS960e5G Data Sheet type: Datasheet TS-960e-5G.exe Jun 4, 2025 version: 1.5.2.0 38.27 MB TS-960e-5G Setup, Contact MTS before upgrading your system, See also TS-960e-5GReadMe.txt type: Setu...
Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
The TS-960e-5G offers users a compact test system that can support both functional and DC parametric test capabilities. It is available with 5G software tools and with a digital vector conversion utility that supports ASCII, WGL, STIL, VCD, eVCD and ATP...
Results from Downloads TS960DS.pdf Jun 4, 2025 version: B 768.57 KB TS960 Data Sheet type: Datasheet TS960e5GDS.pdf Jun 4, 2025 version: C 192.18 KB TS960e5G Data Sheet type: Datasheet TS-960e-5G.exe Jun 4, 2025 version: 1.5.2.0 38.27 MB TS-960e-5G Setup, Cont...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e-5G TS-960e-5G mmWave Device Production Test and Characterization mmWave / 5G PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin PMU Results from Downloads TS960...
Shielded cable with 68 Pin SCSI connectors View GtDio6x-FIT GtDio6x-FIT Import and convert STIL digital vectors (IEEE-1450, Standard Test Interface Language files) to MTS digital vector format Digital File Import Tool Option for GX5296/GX5960 DIO View GtDio6x-...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e Series TS-960e Series High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin Timing &...
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Fan speed control and monitoring is automatic and can be controlled / monitored via the GxChassis software. PXI Clock Integrated 10 MHz PXI clock with auto-detect function. Presence of an external 10 MHz PXI clock will disable the internal clock. PXI clock is ...
System also Includes System Self Test, ATEasy Software License, ICEasy, DIOEasy, and Slide Receiver. PXI 3U View TS-960e-OPT64 TS-960e-OPT64 64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin New Product View GX7950 Series GX7950 ...
Test Solution Categories Semiconductor Production Test Platform Semiconductor Expansion / Upgrade Semiconductor Production Test Platform View Semiconductor Production Test Platform TS-900e-5G Series DC - mmWave 100MHz Vector Rates TS-900e-5G Series View Semico...
Test Solution Categories Semiconductor Test Systems Production Test Systems Bench Top Test Systems Industrial Test Systems Semiconductor Test Systems Semiconductor test solutions for digital and mixed-signal test applications View TS-900e-5G Series TS-900e-5G ...
Application ready from day one, these preconfigured, open architecture test platforms address a range of analog, digital, and mixed-signal test needs, allowing you to focus on developing your application rather than developing the test system.
Test Solution Categories Semiconductor Production Test Platform Semiconductor Expansion / Upgrade 1000 View Semiconductor Production Test Platform TS-900e-5G Series DC - mmWave 100MHz Vector Rates TS-900e-5G Series View Semiconductor Production Test Platform T...
Test Solution Categories Semiconductor Production Test Platform Semiconductor Expansion / Upgrade View Semiconductor Production Test Platform TS-900e-5G Series DC - mmWave 100MHz Vector Rates TS-900e-5G Series View Semiconductor Production Test Platform TS-960...
Easily scalable from 10s to 1000s of channels, the modular open system architecture (MOSA) combines exceptional analog and digital instrumentation performance, with "any resource to any pin" signal routing, for unrivaled test system flexibility.
Its modular, open platform architecture delivers exceptional flexibility when faced with changing test needs, simplifying digital, analog and RF test resource expansion and updates.
High-performance digital, mixed-signal, and RF semiconductor test capabilities
mmWave Device Production Test and Characterization
Intel® mini-PC featuring 11th Generation Core Processor
Apr 12, 2024
SemiEasy is a drop-in user interface designed to provide common semiconductor test features without requiring extensive configuration. Read more...
Oct 7, 2025 version: C 192.18 KB
type: Datasheet
Jun 4, 2025 version: 1.5.2.0 38.27 MB
type: Setup/Package
Jun 4, 2025 version: 1.5.2.0 3.76 MB
type: Manual
May 3, 2022 version: 1.5.2.0 11.94 KB
Jun 25, 2020 version: A 170.54 KB
Nov 7, 2019
Jun 29, 2020
Newsletter Section(s): Solution Spotlight Read more...
Dec 18, 2019
Newsletter Section(s): Product Highlight Read more...
Sep 27, 2019
