GT50-DIO

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Dynamically Controlled High Speed Digital I/O Card

  • 32 bi-directional I/O pins
  • Eight cards may be daisychained for a total of 256 pins
  • 256 Kb to 1 Mb memory behind each pin
  • Programmable clock rates from 750 Hz to 50 MHz
  • Sequencer allows conditional branches, loops, and subroutines
  • Advanced features for UUT synchronization
  • Graphical programming of sequencer and vector generation
  • DISCONTINUED - SEE DETAILS BELOW
Overview
Specifications
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*****Product Availability*****

This product has been discontinued.

The initial release of this product was approximately 1990.

Please contact the factory for availability and alternate product offerings.

Please review the GX52xx Series for the latest product alternatives.

Description

The GT50-DIO is a high-speed dynamic digital I/O card. The GT50-DIO provides all the features of high-speed dynamic digital testers normally seen only in large functional test systems. The GT50-DIO may be combined with other PC instruments to form a mixed-signal test system.

Features

The GT50-DIO provides real-time digital stimulus and capture with 32 pins per card. Up to 8 cards can be daisy-chained in an IBM-compatible computer for a total of up to 256 pins. The supports up to 50 MHz (60 MHz optional) data rates. In all other respects the cards are the same. The 32 pins can be configured as input or output in groups of eight. The direction of each group may be changed dynamically within the sequencer, externally, or both.

Clock and strobe signals are distributed to the cards via a daisy-chained ribbon cable. These signals can be generated internally or externally. The external control signals allow full synchronization with the unit under test (UUT) and minimizes the initialization part of the test. The test step sequencer lets you create loops and branches to manipulate the output vectors. All of the sequencer commands can be conditioned using the external event bus. This gives the GT50-DIO card the capability to generate test vectors indefinitely at maximum test rates. Internal and external trigger and pause commands are available in several modes. The memory behind each pin is configurable from 256 Kbit to 1 Mbit and is user upgradable. Separate memories are provided for output data, response data, and test step sequencing commands. The separate memory for response data lets the application read the activity on the UUT pins independent of the bi-directional mode. This is an important feature lacking in most high speed digital I/O cards.

Configuration

The Timing Module is mounted on the GT50-DIO to create a master. Up to seven additional GT50-DIO slave cards can be driven by one master to form a 256 bit wide vector. The GT50-DIO is provided with 256 K memory. Up to 3 additional memory blocks can be added for a maximum of 1 Mb.

Programming and Software

The board is supplied a 32-bit DLL driver. Various interface files provide access to the DLL from programming tools and languages such as ATEasy, LabVIEW, C/C++, Microsoft Visual Basic®, Delphi, and more. The available virtual panel can be used to interactively adjust and control the instrument from a window that displays the current instrument settings and measurements.
On-Line help file and PDF User's Guide provides documentation that includes instructions for installing, using and programming the board.

Applications

  • Automatic Test Equipment (ATE)
  • High speed functional digital test
  • Digital pattern generator
  • Vector capture
  • Hybrid and digital device test
  • Memory testing
  • Event sequencer, logic pattern capture