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Results from Test Solutions and Products

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Results from Product Accesories

CalEasy Series Calibration & Verification Software for MTS Instrumentation
GX5960 Series High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960A-CALKIT Calibration cable kit for use with the GX5960A DIO modules & CalEasy
GX95917-6 DIO Shielded Flat Cable Assy, Calibration, 6"
GX95917-8 DIO Shielded Flat Cable Assy, Calibration, 8"

Results from Knowledge Base Articles

Q200334

Sep 13, 2021

Digital I/O Hardware Handshaking Using GX5280/GX5290 Series

This article demonstrates how to use GX5280/GX5290 Series external events as hardware handshakes to control test pattern execution Read more...

Q200333

Apr 8, 2020

Appending Multiple Digital Test Patterns to Reduce Test Time

The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...

Q200330

May 6, 2021

Translating STIL, WGL, VCD, EVCD and Teradyne ATP files to DIO/DIO6x Files

DioEasy-FIT and GtDio6x-FIT (File Import Toolkit) allows test engineers to easily import STIL, WGL, VCD, EVCD simulation and Teradyne ATP files to DIO or DIO6x files which are used by MTS digital I/O cards. The FIT when coupled with Marvin’s DIOEasy/GTDIO6x vector development / waveform display tools brings a powerful desktop tool set for debugging and developing digital test vectors for all MTS digital instruments without hardware. This article describes how to use the FIT converter tool to convert files. Read more...

Q200283

Jul 2, 2015
White Paper

White Paper: PXI-Based, Functional Test Solutions for Legacy and Next Generation Test Requirements

For both legacy and next generation test requirements, the PXI architecture offers a robust set of capabilities for performance mixed-signal test applications. By combining the capabilities of a performance digital subsystem (GX5960) with the flexibility of the GX7016 switching subsystem, the GENASYS platform provides all of the capabilities needed to address both legacy and future test needs. And with the modularity of these subsystems, end users have the option to configure these systems with moderate to high pin counts and with a wide range of instrumentation. The GENASYS platform and its subsystems has wide applicability for both factory and depot applications – solving both the legacy and future test needs for high value, mission critical products. Read more...

Q200224

May 7, 2012

PMU Functionality with the GX5960 Series

Overview of the PMU API Functions supported by the GX5960 Series Digital Subsystem Read more...

Q200217

Jun 7, 2011

Using the Gx5960 Pattern Test Flags to Qualify real time compare errors

How to use Pattern Test Flags for Conditional Branching/Halting on Error and Recording Errors Read more...

Q200208

May 6, 2016

Importing Teradyne* DTB files to the Marvin Test Solutions GX5960 Digital Subsystem

This KB article describes how to import an existing .DTB file to the Marvin Test Solutions GX5960 Digital Subsystem, remap .DTB assigned pin numbers to physical pins, execute the digital burst, and query the instrument for real time compare errors. Read more...

Q200196

May 6, 2021

Proper Termination of High-Speed Digital Signals

To guarantee good signal quality in a digital environment, it is important to understand when termination is required and the different methods of terminating a transmission line. Read more...

Results from Press Releases and News

Sep 28, 2012

Geotest-Marvin Test Systems Introduces GENASYS TS-323 Test Platform

Mar 16, 2012

Geotest Introduces CalEasy Software for PXI Products

Sep 13, 2010

Geotest Announces Industry-Leading High-Performance PXI-based Digital Subsystem for Board and Semiconductor Test

Results from Newsletters

Mar 24, 2016

Test Connections March 2016

Newsletter Section(s): Product Highlight Read more...

Mar 25, 2015

Test Connections March 2015

Newsletter Section(s): Did You Know Read more...

Sep 4, 2013

Test Connections September 2013

Newsletter Section(s): Did You Know Read more...

Aug 24, 2012

Geotest Test Connections August 2012

Newsletter Section(s): Product Highlight; Did You Know Read more...

Jun 29, 2012

Geotest Test Connections June 2012

Newsletter Section(s): Product Highlight Read more...

Apr 26, 2012

Geotest Test Connections April 2012

Newsletter Section(s): Product Highlight Read more...

Mar 13, 2012

Geotest Test Connections March 2012

Newsletter Section(s): Product Highlight; Solution Spotlight Read more...

Dec 13, 2011

Geotest Test Connections December 2011

Newsletter Section(s): Product Highlight Read more...

Nov 1, 2011

Geotest Test Connections November 2011

Newsletter Section(s): In The News Read more...

Mar 17, 2011

Geotest Test Connections March 2011

Newsletter Section(s): Focus On Read more...

Jan 26, 2011

Geotest Test Connections January 2011

Newsletter Section(s): In The News Read more...

Oct 20, 2010

Geotest Test Connections October 2010

Newsletter Section(s): Focus On; Product Highlight Read more...

Sep 7, 2010

Geotest Test Connections September 2010

Newsletter Section(s): Focus On; Product Highlight Read more...