The GENASYS Semi TS-960 is a PXI-based integrated semiconductor test platform. [1] It is available as a bench top system or with an integrated manipulator. [1] The TS-960 utilizes the PXI architecture to provide a cost-effective test solution for device, SoC, and SiP test applications. [1] It features a high power PXI chassis and a custom-designed test interface that supports PCB DUT boards. [1] The receiver interface's pin blocks are field configurable. [1]
The TS-960 can support up to 512 dynamic digital channels, as well as analog, device power supply (DPS) and RF resources. [1] The basic system includes 64 digital I/O channels, 64 static digital I/O channels, a programmable DPS, a system self-test and fixture, software for digital waveform editing / display, ICEasy device test development tools, and ATEasy software. [1] The TS-960 has 14 PXI slots available for adding more digital or analog test resources. [1] It is suitable for semiconductor OEMs, fabless semiconductor vendors, incoming inspection / counterfeit detection labs and packaging / test vendors. [1] For production test applications, the TS-960 is available with the Reid - Ashman OM1069 manipulator. [1]
The TS-960 core system includes a 20-slot, high-power PXI chassis with an integral receiver interface and an embedded Core 2 Duo controller with Windows 7. [1] The base TS-960 platform uses the GX5296, a 3U PXI, 32 channel 125 MHz digital I/O card with timing and PMU per pin capability. [1] The system is supplied with software development and digital vector conversion tools, including support for ASCII, WGL, STIL, VCD/eVCD and ATP vector formats. [1]
Key features and specifications of the TS-960 include:
Digital I/O: Up to 512 dynamic digital channels. [1] 64 125 MHz digital channels with per pin PMU and per pin timing, expandable to 512. [1] 64 static digital channels (expandable to 128). [1]
DPS: Programmable 0 to 48 V DPS, expandable to multiple channels. [1]
Receiver Interface: Modular, pogo-pin style receiver interface. [1]
PXI Triggers: 8 per segment, software controlled segment mapping. [1]
PXI Clock: Integrated 10 MHz PXI clock with auto-detect function. [1]
SMU Option: 4-channel, 4 quadrant operation, isolated outputs, common ground, with remote sense. [1]
Dynamic Digital I/O Subsystem: Maximum Clock Rate 125 MHz. [1]
Auxiliary I/O Channels: 4 channels, can be used for timing / control functions or for static I/O. [1]
Shmoo Plot Tool: Allows users to vary test parameters on both the X and Y axis without programming. [1]
Chassis: GX7305 20 slot, high power 3U PXI chassis. [1]
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Available as a bench top system or with an integrated manipulator, the TS-960 takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
Results from Test Solutions and Products PXI 3U View TS-960e-OPT64 TS-960e-OPT64 64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin Select Your Country Email this Page Your Name Required Your Email Required (use commas to separate...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e TS-960e High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconductor Test System with Timing per Pin Digital Subsystem PXIe 3U New Product View TS-96...
Results from Test Solutions and Products PXI 3U View TS-960e-OPT64 TS-960e-OPT64 64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin Select Your Country Email this Page Your Name Required Your Email Required (use commas to separate...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e TS-960e High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconductor Test System with Timing per Pin Digital Subsystem PXIe 3U New Product View TS-96...
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The TS-960 brings the performance and features of high-end systems to customers at a fraction of the footprint and with outstanding value compared to traditional ATE. “Our semiconductor customers asked for an alternative to big-iron ATE systems that would comb...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e Series TS-960e Series High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin Timing &...
The TS-960e-5G is the ideal test solution for semiconductor OEMs, fabless semiconductor vendors, incoming inspection / counterfeit detection labs and packaging / test vendors needing a cost-effective, configurable mmWave test system.
The TS- 960e features a handler compatible slide receiver, which offers the flexibility to interface to virtually any device handler. In addition, fixture compatibility is maintained with both the TS-900 and TS-960 test systems, allowing users to interchange l...
The TS-960e-5G is the ideal test solution for semiconductor OEMs, fabless semiconductor vendors, incoming inspection / counterfeit detection labs and packaging / test vendors needing a cost-effective, configurable mmWave test system.
Shielded cable with 68 Pin SCSI connectors View GtDio6x-FIT GtDio6x-FIT Import and convert STIL digital vectors (IEEE-1450, Standard Test Interface Language files) to MTS digital vector format Digital File Import Tool Option for GX5296/GX5960 DIO View GtDio6x-...
The TS-960e features a handler compatible slide receiver, which offers the flexibility to interface to virtually any device handler. In addition, fixture compatibility is maintained with both the TS-900 and TS-960 test systems, allowing users to interchange lo...
The TS-960EX-5G's device interface board (DIB) / receiver interface is designed to be compatible with virtually any device handler. FEATURES The TS-96EX-5G can be configured with up to 256 dynamic digital channels.
The TS-960e is a flexible, open-architecture semiconductor test solution which offers PXI Express performance and digital, mixed-signal and RF test capabilities in a compact, single-chassis footprint.
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If you cannot find what you are looking for feel free to Contact Us. Results from Test Solutions and Products PXIe 3U New Product View TS-960e Series TS-960e Series High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconduct...
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The TS-960e-5G offers users a compact test system that can support both functional and DC parametric test capabilities. It is available with 5G software tools and with a digital vector conversion utility that supports ASCII, WGL, STIL, VCD, eVCD and ATP...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e-5G TS-960e-5G mmWave Device Production Test and Characterization mmWave / 5G PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin PMU Results from Downloads TS960...
The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.
Qty TS-960e-OPT64 64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin View required/recommended products Call for Pricing *Valid Quantity Required Required / Recommended Products No Required/Recommended Products Found ATEasy Licens...
Available as a bench top or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for digital, mixed – signal or RF test applications.
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