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53 GHz VNA RF test performance
High-performance digital, mixed-signal, and RF semiconductor test capabilities
Intel® mini-PC featuring 11th and 13th Generation Core Processors
Hosts any two of the GT5150 I/O modules
Programmable levels and thresholds with tristate control
PECL to TTL and TTL to PECL
20 slots supporting one 6U or 3U (embedded or remote) PXI controller and 19 PXI or cPCI instruments (3U or 6U)
18 inch harness, 25 pin DSUB , male to male
Comprehensive suite of software tools for semiconductor test applications
Apr 12, 2024
SemiEasy is a drop-in user interface designed to provide common semiconductor test features without requiring extensive configuration. Read more...
May 20, 2024
Enhancements to ATEasy and its software drivers include support for scalable test program development, test execution time optimization, and parallel test support with existing ATEasy test code. Read more...
May 6, 2016
This article demonstrates the advantages of the flexible, scalable PXI platform's open architecture hardware and software for semiconductor test. Read more...
Nov 30, 2015 White Paper
Presentation: Presented at the corporate forum, International Test Conference 2015 Read more...
Oct 13, 2015 White Paper
The next generation of PXI digital instrumentation offers the capabilities and test features normally only found in proprietary ATE semiconductor systems. This paper provides and overview of how new, advanced PXI digital subsystems can address semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities for digital, mixed-signal and RF test applications. Read more...
Sep 26, 2022
This article describes ICEasy add-on module used for Semiconductor test using Marvin Test Solutions DIO boards with PMU Read more...
Jun 1, 2021
Tips and consideration when designing Load board for the TS-900 semiconductor test system Read more...
Jun 17, 2013 White Paper
The PXI architecture and specifically PXI -based systems offers semiconductor test engineers a flexible and modular platform for supporting device verification and focused production test of digital and mixed signal devices. Read more...
Jun 11, 2013
How to use the Shmoo plot tool with ATEasy v9 Read more...
This article explain the effects of IC test socket contamination on contact resistance with different lead platings Read more...
Nov 8, 2011 1 Reply 6341 Views
We are pleased to announce to you that our TS-900 PXI Semiconductor Test System is a contender for the Best in Test Award from Test and Measurement World (publication). ... Read more... 4/23/2015 8:27:05 AM by Olga T.
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Newsletter Section(s): Product Highlight; Solution Spotlight Read more...
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Oct 28, 2020 1 Comment
mmWave beamforming devices are essential for implementing phased array and mmWave antennas, and with the emergence of 5G networks the demand for these devices continues to grow. Production test of these devices has been both complicated and slow, especially with the emergence of multi-port beamforming devices (5, 9 and even 17 mmWave ports) designed for 5G NR networks. Read more...