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Results from Test Solutions and Products

Results from Knowledge Base Articles

Q200357

Apr 12, 2024

SemiEasy Semiconductor Production Test User Interface and Features

SemiEasy is a drop-in user interface designed to provide common semiconductor test features without requiring extensive configuration. Read more...

Q200356

May 20, 2024

Multi-site Production Test Development in ATEasy

Enhancements to ATEasy and its software drivers include support for scalable test program development, test execution time optimization, and parallel test support with existing ATEasy test code. Read more...

Q200289

May 6, 2016

Solution Spotlight: Advanced Digital Testing Using PXI Instrumentation

This article demonstrates the advantages of the flexible, scalable PXI platform's open architecture hardware and software for semiconductor test. Read more...

Q200286

Nov 30, 2015
White Paper

White Paper: Leveraging Open Architecture, Modular Test Platforms for ATE

Presentation: Presented at the corporate forum, International Test Conference 2015 Read more...

Q200285

Oct 13, 2015
White Paper

White Paper: PXI–Based Semiconductor Test Systems: Advanced Test Capabilities and Features

The next generation of PXI digital instrumentation offers the capabilities and test features normally only found in proprietary ATE semiconductor systems. This paper provides and overview of how new, advanced PXI digital subsystems can address semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities for digital, mixed-signal and RF test applications. Read more...

Q200261

Sep 26, 2022

Getting Started with ICEasy

This article describes ICEasy add-on module used for Semiconductor test using Marvin Test Solutions DIO boards with PMU Read more...

Q200251

Jun 1, 2021

TS-900 Load Board Design Considerations

Tips and consideration when designing Load board for the TS-900 semiconductor test system Read more...

Q200246

Jun 17, 2013
White Paper

White Paper: Addressing Semiconductor Test with PXI

The PXI architecture and specifically PXI -based systems offers semiconductor test engineers a flexible and modular platform for supporting device verification and focused production test of digital and mixed signal devices. Read more...

Q200244

Jun 11, 2013

Using ICEasy's Shmoo Plot Tool with ATEasy

How to use the Shmoo plot tool with ATEasy v9 Read more...

Q200240

Jun 1, 2021

IC Test Socket Contamination

This article explain the effects of IC test socket contamination on contact resistance with different lead platings Read more...

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Results from User Forums

Dede V.

Nov 8, 2011
1 Reply
6341 Views

TS-900 PXI Semiconductor Test System - Vote For Best In Test Award

We are pleased to announce to you that our TS-900 PXI Semiconductor Test System is a contender for the Best in Test Award from Test and Measurement World (publication). ...
Read more...
4/23/2015 8:27:05 AM by Olga T.

Results from Press Releases and News

Apr 27, 2021

Innovative 5G mmWave Test Systems See Broad Industry Adoption

Apr 6, 2021

Marvin Test Solutions’ TS-900e-5G Selected for mmWave Device Production Test

Jul 9, 2018

Marvin Test Solutions Achieves AS9100D Certification

Sep 6, 2016

Marvin Test Solutions Expands TS-900 Platform

Jun 30, 2016

Marvin Test Solutions to Feature Expanded Semiconductor Test Capabilities at SEMICON West 2016

Dec 4, 2014

Marvin Test Solutions Brings New Capabilities to PXI-Based Semiconductor Test with TS-960

Jun 11, 2013

New Name, Same Aim for Marvin Test Solutions

Feb 5, 2013

Geotest Enters Partnership with PSI Solutions

Feb 5, 2013

Geotest Adds Testmation, Inc. as South Korean Distributor

Nov 28, 2012

Geotest Signs T&M Systems B.V. as New Belgium Distributor

Aug 6, 2012

Geotest Names New Distributor for UK and Ireland

Jul 6, 2012

Geotest Expands Capabilities of the TS-900 PXI Semiconductor Test System for Production Testing

Jan 16, 2012

Geotest Adds VigVen Tech Mark to Distribution Channel

Aug 31, 2011

Geotest Enters Sales Agreement with Robson Technologies, Inc. (RTI)

Jul 6, 2011

Geotest Announces PXI Semiconductor Test System for Digital and Mixed Signal Test Applications

Jul 23, 2004

Geotest Receives ISO 9001:2000 Re-Certification

Results from Newsletters

May 10, 2023

Test Connections May 2023

Newsletter Section(s): Product Highlight; Solution Spotlight Read more...

Dec 15, 2022

Test Connections December 2022

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Oct 31, 2022

Test Connections October 2022

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Aug 31, 2022

Test Connections August 2022

Newsletter Section(s): In The News Read more...

Jun 30, 2022

Test Connections June 2022

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Apr 25, 2022

Test Connections April 2022

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Mar 21, 2022

Test Connections March 2022

Newsletter Section(s): Product Highlight; In The News Read more...

Dec 22, 2021

Test Connections December 2021

Newsletter Section(s): In The News; Did You Know Read more...

Oct 29, 2021

Test Connections October 2021

Newsletter Section(s): In The News Read more...

Sep 7, 2021

Test Connections September 2021

Newsletter Section(s): Focus On; In The News; Did You Know Read more...

Jun 29, 2021

Test Connections June 2021

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Apr 30, 2021

Test Connections April 2021

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Feb 26, 2021

Test Connections February 2021

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Oct 29, 2020

Test Connections October 2020

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Aug 31, 2020

Test Connections August 2020

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Sep 14, 2018

Test Connections September 2018

Newsletter Section(s): Did You Know Read more...

Dec 1, 2016

Test Connections November 2016

Newsletter Section(s): Product Highlight; In The News Read more...

Sep 6, 2016

Test Connections September 2016

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Mar 24, 2016

Test Connections March 2016

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Dec 10, 2015

Test Connections December 2015

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Dec 11, 2014

Test Connections December 2014

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Jun 30, 2014

Test Connections June 2014

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Sep 4, 2013

Test Connections September 2013

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Feb 19, 2013

Geotest Test Connections February 2013

Newsletter Section(s): Focus On; In The News Read more...

Dec 19, 2012

Geotest Test Connections December 2012

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Aug 24, 2012

Geotest Test Connections August 2012

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Jun 29, 2012

Geotest Test Connections June 2012

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Apr 26, 2012

Geotest Test Connections April 2012

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Mar 13, 2012

Geotest Test Connections March 2012

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Dec 13, 2011

Geotest Test Connections December 2011

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Nov 1, 2011

Geotest Test Connections November 2011

Newsletter Section(s): Focus On; Solution Spotlight; In The News Read more...

Aug 30, 2011

Geotest Test Connections August 2011

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Jul 6, 2011

Geotest Test Connections July 2011

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Results from Blog Articles

Jon Semancik

Oct 28, 2020

1 Comment

5G / mmWave 53 GHz Production Test Performance

mmWave beamforming devices are essential for implementing phased array and mmWave antennas, and with the emergence of 5G networks the demand for these devices continues to grow.  Production test of these devices has been both complicated and slow, especially with the emergence of multi-port beamforming devices (5, 9 and even 17 mmWave ports) designed for 5G NR networks.   Read more...

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