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Available as a bench top system or with an integrated manipulator, the TS-960 takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
TS-960-OM TS-960-OM.
Results from Test Solutions and Products PXI 3U View TS-960e-OPT64 TS-960e-OPT64 64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin Select Your Country Email this Page Your Name Required Your Email Required (use commas to separate...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e TS-960e High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconductor Test System with Timing per Pin Digital Subsystem PXIe 3U New Product View TS-96...
The TS-960 brings the performance and features of high-end systems to customers at a fraction of the footprint and with outstanding value compared to traditional ATE. “Our semiconductor customers asked for an alternative to big-iron ATE systems that would comb...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e Series TS-960e Series High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin Timing &...
The TS-960e-5G is the ideal test solution for semiconductor OEMs, fabless semiconductor vendors, incoming inspection / counterfeit detection labs and packaging / test vendors needing a cost-effective, configurable mmWave test system.
The TS- 960e features a handler compatible slide receiver, which offers the flexibility to interface to virtually any device handler. In addition, fixture compatibility is maintained with both the TS-900 and TS-960 test systems, allowing users to interchange l...
The TS-960e features a handler compatible slide receiver, which offers the flexibility to interface to virtually any device handler. In addition, fixture compatibility is maintained with both the TS-900 and TS-960 test systems, allowing users to interchange lo...
Shielded cable with 68 Pin SCSI connectors View GtDio6x-FIT GtDio6x-FIT Import and convert STIL digital vectors (IEEE-1450, Standard Test Interface Language files) to MTS digital vector format Digital File Import Tool Option for GX5296/GX5960 DIO View GtDio6x-...
The TS-960EX-5G's device interface board (DIB) / receiver interface is designed to be compatible with virtually any device handler. FEATURES The TS-96EX-5G can be configured with up to 256 dynamic digital channels.
The TS-960e is a flexible, open-architecture semiconductor test solution which offers PXI Express performance and digital, mixed-signal and RF test capabilities in a compact, single-chassis footprint.
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If you cannot find what you are looking for feel free to Contact Us. Results from Test Solutions and Products PXIe 3U New Product View TS-960e Series TS-960e Series High-performance digital, mixed-signal, and RF semiconductor test capabilities PXIe Semiconduct...
The TS-960e-5G offers users a compact test system that can support both functional and DC parametric test capabilities. It is available with 5G software tools and with a digital vector conversion utility that supports ASCII, WGL, STIL, VCD, eVCD and ATP...
Results from Test Solutions and Products PXIe 3U New Product View TS-960e-5G TS-960e-5G mmWave Device Production Test and Characterization mmWave / 5G PXIe Semiconductor Test System, 64 Dynamic Digital I/O Channels with per Pin PMU Results from Downloads TS960...
The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.
Qty TS-960e-OPT64 64 Additional Dynamic 125 MHz Digital I/O channels with timing & PMU per pin View required/recommended products Call for Pricing *Valid Quantity Required Required / Recommended Products No Required/Recommended Products Found ATEasy Licens...
Available as a bench top or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for digital, mixed – signal or RF test applications.
Search Results For: "PXIE SEMICONDUCTOR TEST SYSTEM TS 960E TS 960E SERIES" | Marvin Test Solutions, Inc. Sign In Cart Test Solutions Aircraft F-15 F-16 F/A-18 F-35 AH-64 Remotely Piloted Aircraft (RPA) Weapons Systems AGM-65 Maverick AGM-114 Hellfir...
High-performance digital, mixed-signal, and RF semiconductor test capabilities
mmWave Device Production Test and Characterization
PXI-based architecture offers compact footprint, open architecture, and expandability
Preconfigured, cost effective, functional test solutions for analog, digital, mixed signal and avionics applications
6U PXI chassis with integrated MAC Panel SCOUT receiver
Intel® mini-PC featuring 11th Generation Core Processor
Supports automated calibration and verification of Marvin Test Solutions instrumentation
Imports, converts and executes IEEE-1445 compliant .tap files from a LASAR simulation for use with MTS digital hardware and digital functional test systems
Apr 12, 2024
SemiEasy is a drop-in user interface designed to provide common semiconductor test features without requiring extensive configuration. Read more...
May 20, 2024
Enhancements to ATEasy and its software drivers include support for scalable test program development, test execution time optimization, and parallel test support with existing ATEasy test code. Read more...
Mar 9, 2021
The following article discusses the relative merits of two types of multi-site digital semiconductor test system designs. This article focuses on using GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...
Sep 13, 2021
This article demonstrates how to use GX5280/GX5290 Series external events as hardware handshakes to control test pattern execution Read more...
Jul 28, 2023
The following article describes how to streamline a digital application by merging digital test patterns into one compressed file that can be loaded once and accessed for each digital test. The examples provided use the GtDio6x and ATEasy software packages to program and control PXI GX5960 series or the GX5296 digital IO boards. Read more...
May 6, 2021
DioEasy-FIT and GtDio6x-FIT (File Import Toolkit) allows test engineers to easily import STIL, WGL, VCD, EVCD simulation and Teradyne ATP files to DIO or DIO6x files which are used by MTS digital I/O cards. The FIT when coupled with Marvin’s DIOEasy/GTDIO6x vector development / waveform display tools brings a powerful desktop tool set for debugging and developing digital test vectors for all MTS digital instruments without hardware. This article describes how to use the FIT converter tool to convert files. Read more...
Jul 2, 2015 White Paper
For both legacy and next generation test requirements, the PXI architecture offers a robust set of capabilities for performance mixed-signal test applications. By combining the capabilities of a performance digital subsystem (GX5960) with the flexibility of the GX7016 switching subsystem, the GENASYS platform provides all of the capabilities needed to address both legacy and future test needs. And with the modularity of these subsystems, end users have the option to configure these systems with moderate to high pin counts and with a wide range of instrumentation. The GENASYS platform and its subsystems has wide applicability for both factory and depot applications – solving both the legacy and future test needs for high value, mission critical products. Read more...
Nov 24, 2014 White Paper
An overview of how the PXI architecture, associated instrumentation and software can provide the basis for a modern functional test platform that can effectively support both legacy ATE functionality as well as future functional test needs. Read more...
Oct 8, 2020
This article demonstrates how to use external events to control test pattern execution Read more...
May 7, 2012
Overview of the PMU API Functions supported by the GX5960 Series Digital Subsystem Read more...
Jul 13, 2022 33 Replies 2450 Views
Hi,I am currently trying to read data from the ESP32.I have programmed the ESP to send the string "Hello" continuously in an endless loop with a line break after ea... Read more... 7/31/2022 11:36:12 PM by Hendrik R.
Oct 7, 2025 version: C 192.18 KB
type: Datasheet
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Jun 4, 2025 version: 1.5.2.0 38.27 MB
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Jun 4, 2025 version: 1.5.2.0 3.76 MB
type: Manual
May 3, 2022 version: 1.5.2.0 11.94 KB
Sep 30, 2020 version: 1.1 2.89 MB
Jun 25, 2020 version: A 170.54 KB
Dec 27, 2017 version: 1.0 3.24 MB
Jun 17, 2014 version: 1.0 2.55 MB
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Newsletter Section(s): Focus On; Product Highlight; Did You Know Read more...
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Newsletter Section(s): Product Highlight; In The News Read more...
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Newsletter Section(s): Product Highlight; Did You Know Read more...
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Have you ever bought a vehicle with thousands of dollars of extra add-ons, which you didn’t want and know you won’t use? My guess is, if you did, it was out of necessity and not something anyone would chose to do. Who would want to increase their overall purchase price for things they can’t and won’t use? I for one would not. Read more...
