Knowledge Base - Product.aspx

Articles

Knowledge base articles covering topics such as integration of Marvin Test Solutions products, new functionality, and frequently asked questions. Articles cover PXI Instruments, ATEasy software, LabView integration, etc. and should be a first stop for anyone with questions.

Sustainment Challenges and Approaches for Legacy ATE Systems

This paper examines the sustainment challenges test engineers face when tasked with keeping legacy ATE operational.

Download Now

Showing 1 - 10 of 16 Items | 1 2 | View All
Q200273

Jun 10, 2020

Using HW PXI/PCI Explorer Applet

This article explains the features and benefits of the PXI/PCI Explorer application included in the Marvin Test Solutions HW software package. Read more...

  
Q200314

Jun 14, 2018

Trendar / Fluke 3050B Digital Subsystem Replacement

This technical brief offers a notional implementation for replacing the Trendar / Fluke 3050B digital subsystem with a PXI-based, MTS digital subsystem. Read more...

  
Q200293

Jun 7, 2016

Solution Spotlight: Replacing Legacy Instrumentation with Form/Fit/Function (FFF) Instrumentation

Form/Fit/Function replacement of legacy instrumentation provides a superior solution that preserves investment in ATE hardware and TPS's Read more...

  
Q200290

May 16, 2016

Solution Spotlight: Expanding Digital Test Capabilities with a Multi-Site Test Feature

Test engineers are constantly challenged to do more with their test resources. One method to improve overall test throughput and test resource utilization is to implement a multi-site test strategy for testing semiconductor or board level products. Read more...

  
Q200289

May 6, 2016

Solution Spotlight: Advanced Digital Testing Using PXI Instrumentation

This article demonstrates the advantages of the flexible, scalable PXI platform's open architecture hardware and software for semiconductor test. Read more...

  
Q200266

Sep 13, 2014

"Unable to open HW.SYS/VXD" or "Unable to open HW Device Driver" error when opening ATEasy

This an article that helps solve the Unable to Open HW error that appear when you start ATEasy and other Marvin Test Solutions software Read more...

  
Q200250

Jan 13, 2014

Using ATEasy and DSI Software to Run and Analyze Test Programs

This article summarizes the videos displaying the interaction between ATEasy and eXpress software suites for testing analyzing your test results. Read more...

  
Q200224

May 7, 2012

PMU Functionality with the GX5960 Series

Overview of the PMU API Functions supported by the GX5960 Series Digital Subsystem Read more...

  
Q200208

Jan 21, 2011

Importing Teradyne* DTB files to the Marvin Test Solutions GX5960 Digital Subsystem

This KB article describes how to import an existing .DTB file to the Marvin Test Solutions GX5960 Digital Subsystem, remap .DTB assigned pin numbers to physical pins, execute the digital burst, and query the instrument for real time compare errors. Read more...

  
Q200212

Dec 16, 2010

Guidelines for designing a custom GX3500 expansion board

This article introduces the GX3500 Expansion Interface board and provides an overview of the guidelines for designing a custom expansion interface board for the GX3500. Read more...

  
Showing 1 - 10 of 16 Items | 1 2 | View All